Evidence map›Paper›PMID 37559176›Full record

ArticleAdvanced science (Weinheim, Baden-Wurttemberg, Germany)2023

Device-Algorithm Co-Optimization for an On-Chip Trainable Capacitor-Based Synaptic Device with IGZO TFT and Retention-Centric Tiki-Taka Algorithm.

Jongun Won, Jaehyeon Kang, Sangjun Hong, Narae Han, Minseung Kang, Yeaji Park, Youngchae Roh, Hyeong Jun Seo, Changhoon Joe, Ung Cho and 9 more

Open access · goldAbstract read
In one paragraph

Article in Advanced science (Weinheim, Baden-Wurttemberg, Germany), 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 6 papers.

0numbers the graph read from it
0cells of the map it votes in
6citing papers in PubMed
2.9field-weighted citation impact, top 9% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

6 citing papers in PubMed, 22 citations in OpenAlex.

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4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

19 authors at 4 institutions in 1 country.

Jongun WonDepartment of Materials Science & Engineering, Inter-university Semiconductor Research Center, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
Jaehyeon KangDepartment of Materials Science & Engineering, Inter-university Semiconductor Research Center, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
Sangjun HongDevice Solutions, Samsung Electronics, Pyeongtaek, 17786, Republic of Korea.
Narae HanDepartment of Materials Science & Engineering, Inter-university Semiconductor Research Center, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
Minseung KangDepartment of Materials Science & Engineering, Inter-university Semiconductor Research Center, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
Yeaji ParkDepartment of Materials Science & Engineering, Inter-university Semiconductor Research Center, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
Youngchae RohDepartment of Materials Science & Engineering, Inter-university Semiconductor Research Center, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
Hyeong Jun SeoDepartment of Materials Science & Engineering, Inter-university Semiconductor Research Center, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
Changhoon JoeDepartment of Materials Science & Engineering, Inter-university Semiconductor Research Center, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
Ung ChoDepartment of Materials Science & Engineering, Inter-university Semiconductor Research Center, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.
Minil KangDepartment of Semiconductor System Engineering, Korea University, Seoul, 02841, Republic of Korea.
Minseong UmSchool of Electrical Engineering, Korea University, Seoul, 02841, Republic of Korea.
Kwang-Hee LeeSamsung Advanced Institute of Technology (SAIT), Samsung Electronics, Suwon-si, 16678, Republic of Korea.
Jee-Eun YangSamsung Advanced Institute of Technology (SAIT), Samsung Electronics, Suwon-si, 16678, Republic of Korea.
Moonil JungSamsung Advanced Institute of Technology (SAIT), Samsung Electronics, Suwon-si, 16678, Republic of Korea.
Hyung-Min LeeSchool of Electrical Engineering, Korea University, Seoul, 02841, Republic of Korea.
Saeroonter OhDepartment of Electrical and Electronic Engineering, Hanyang University, Ansan, 15588, Republic of Korea.
Sangwook KimSamsung Advanced Institute of Technology (SAIT), Samsung Electronics, Suwon-si, 16678, Republic of Korea.
Sangbum KimDepartment of Materials Science & Engineering, Inter-university Semiconductor Research Center, Research Institute of Advanced Materials, Seoul National University, Seoul, 08826, Republic of Korea.ORCID https://orcid.org/0000-0001-7460-3750
Seoul National University · KRSamsung (South Korea) · KRKorea University · KRHanyang University · KR

Funding

National Research Foundation of Korea funded by Ministry of Science and ICT NRF-2020M3F3A2A01081240National Research Foundation of Korea funded by Ministry of Science and ICT NRF-2021M3F3A2A02037889
6 · The paper itself

Abstract

Analog in-memory computing synaptic devices are widely studied for efficient implementation of deep learning. However, synaptic devices based on resistive memory have difficulties implementing on-chip training due to the lack of means to control the amount of resistance change and large device variations. To overcome these shortcomings, silicon complementary metal-oxide semiconductor (Si-CMOS) and capacitor-based charge storage synapses are proposed, but it is difficult to obtain sufficient retention time due to Si-CMOS leakage currents, resulting in a deterioration of training accuracy. Here, a novel 6T1C synaptic device using only n-type indium gaIlium zinc oxide thin film transistor (IGZO TFT) with low leakage current and a capacitor is proposed, allowing not only linear and symmetric weight update but also sufficient retention time and parallel on-chip training operations. In addition, an efficient and realistic training algorithm to compensate for any remaining device non-idealities such as drifting references and long-term retention loss is proposed, demonstrating the importance of device-algorithm co-optimization.

Indexed as

device-algorithm co-optimizationindium gallium zinc oxide thin film transistor (IGZO TFT)in-memory computingneuromorphictiki-taka algorithm

Identifiers

PMID37559176
PMCPMC10582414
OpenAlexW4385715281

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.