ArticleACS omega2023
Unravelling the Data Retention Mechanisms under Thermal Stress on 2D Memristors.
Article in ACS omega, 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.
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Who cites it
3 citing papers in PubMed.
- Study on Electrical Behavior of TiONanomaterials (Basel, Switzerland) · 2026Article
- Introduction of Tunneling Oxide and Oxidation Process Effects for Reliable Si-Compatible Resistive-Switching Random-Access Memory.ACS nanoscience Au · 2026Article
- Reconfigurable skin electronics enabled by intrinsically stretchable photoelectric memory transistors.Nature communications · 2026Article
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Authors and funding
2 authors.
Funding
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Abstract
Memristors based on two-dimensional (2D) materials are a rapidly growing research area due to their potential in energy-efficient in-memory processing and neuromorphic computing. However, the data retention of these emerging memristors remains sparsely investigated, despite its crucial importance to device performance and reliability. In this study, we employ kinetic Monte-Carlo simulations to investigate the data retention of a 2D planar memristor. The operation of the memristor depends on field-driven on defect migration, while thermal diffusion gradually evens the defect distribution, leading to the degradation of the high resistance state (HRS) and diminishing the ON/OFF ratio. Notably, we examine the resilience of devices based on single crystals of transition metal dichalcogenides (TMDs) in harsh environments. Specifically, our simulations show that MoS
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