ArticleSensors (Basel, Switzerland)2023
Mid-Level Data Fusion Combined with the Fingerprint Region for Classification DON Levels Defect of Fusarium Head Blight Wheat.
Article in Sensors (Basel, Switzerland), 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.
What it found
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
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Who cites it
1 citing paper in PubMed, 5 citations in OpenAlex.
- Wheat Fusarium Head Blight Automatic Non-Destructive Detection Based on Multi-Scale Imaging: A Technical Perspective.Plants (Basel, Switzerland) · 2024Review
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Authors and funding
4 authors at 1 institution in 1 country.
Funding
Abstract
In this study, a method of mid-level data fusion with the fingerprint region was proposed, which was combined with the characteristic wavelengths that contain fingerprint information in NIR and FT-MIR spectra to detect the DON level in FHB wheat during wheat processing. NIR and FT-MIR raw spectroscopy data on normal wheat and FHB wheat were obtained in the experiment. MSC was used for pretreatment, and characteristic wavelengths were extracted by CARS, MGS and XLW. The variables that can effectively reflect fingerprint information were retained to build the mid-level data fusion matrix. LS-SVM and PLS-DA were applied to investigate the performance of the single spectroscopic model, mid-level data fusion model and mid-level data fusion with fingerprint information model, respectively. The experimental results show that mid-level data fusion with a fingerprint information strategy based on fused NIR and FT-MIR spectra represents an effective method for the classification of DON levels in FHB wheat samples.
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Registered trials
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