ArticleSensors (Basel, Switzerland)2023
Validation of High-Availability Model for Edge Devices and IIoT.
Article in Sensors (Basel, Switzerland), 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.
What it found
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
The trial behind it
Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.
Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.
Who cites it
1 citing paper in PubMed, 7 citations in OpenAlex.
- Adaptive fault tolerance mechanisms for ensuring high availability of digital twins in distributed edge computing systems.Scientific reports · 2025Article
Corrections and comments
PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.
Authors and funding
3 authors at 1 institution in 1 country.
Funding
No grant is acknowledged in the PubMed record.
Abstract
Competitiveness in industry requires smooth, efficient, and high-quality operation. For some industrial applications or process control and monitoring applications, it is necessary to achieve high availability and reliability because, for example, the failure of availability in industrial production can have serious consequences for the operation and profitability of the company, as well as for the safety of employees and the surrounding environment. At present, many new technologies that use data obtained from various sensors for evaluation or decision-making require the minimization of data processing latency to meet the needs of real-time applications. Cloud/Fog and Edge computing technologies have been proposed to overcome latency issues and to increase computing power. However, industrial applications also require the high availability and reliability of devices and systems. The potential malfunction of Edge devices can cause a failure of applications, and the unavailability of Edge computing results can have a significant impact on manufacturing processes. Therefore, our article deals with the creation and validation of an enhanced Edge device model, which in contrast to the current solutions, is aimed not only at the integration of various sensors within manufacturing solutions, but also brings the required redundancy to enable the high availability of Edge devices. In the model, we use Edge computing, which performs the recording of sensed data from various types of sensors, synchronizes them, and makes them available for decision making by applications in the Cloud. We focus on creating a suitable Edge device model that works with the redundancy, by using either mirroring or duplexing via a secondary Edge device. This enables high Edge device availability and rapid system recovery in the event of a failure of the primary Edge device. The created model of high availability is based on the mirroring and duplexing of the Edge devices, which support two protocols: OPC UA and MQTT. The models were implemented in the Node-Red software, tested, and subsequently validated and compared to confirm the required recovery time and 100% redundancy of the Edge device. In the contrast to the currently available Edge solutions, our proposed extended model based on Edge mirroring is able to address most of the critical cases, where fast recovery is required, and no adjustments are needed for critical applications. The maturity level of Edge high availability can be further extended by applying Edge duplexing for process control.
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Registered trials
Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.