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ArticleRecent patents on nanotechnology2024

Investigations on Cylindrical Surrounding Double-gate (CSDG) Mosfet using AL

Naveenbalaji Gowthaman, Viranjay M Srivastava

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Article in Recent patents on nanotechnology, 2024. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

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1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

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3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

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4 · The record

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5 · Who and what money

Authors and funding

2 authors.

Naveenbalaji GowthamanDepartment of Electronic Engineering, University of KwaZulu-Natal, Durban, 4041, South Africa.ORCID 0000-0002-7030-7919
Viranjay M SrivastavaDepartment of Electronic Engineering, University of KwaZulu-Natal, Durban, 4041, South Africa.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

BACKGROUND/

introductionThe Cylindrical Surrounding Double-Gate MOSFET has been designed using Aluminium Gallium Arsenide in its arbitrary alloy form alongside Indium Phosphide with Lanthanum Dioxide as a high-ƙ dielectric material.

objectiveTo conduct research on the novel application of Al

methodsThe usage of 2 Dimensional Electron Gas has been outstanding in recent years to help the electron buildup and charge carrier accumulation in the MOSFETs regime. Device simulation used for the smart integral systems is an electronic simulator that uses the physical robustness and the mathematical modeling of semiconductor heterostructures. In this research work, the fabrication method of Cylindrical Surrounding Double Gate MOSFET has been discussed and realized. The scaling down of the devices is essential to reduce the area of the chip and heat generation. By using these cylindrical structures, the area of contact with the circuit platform is reduced since the cylinder can be laid down horizontally.

resultsThe coulomb scattering rate is observed to be 18.3 % lower than the drain terminal when compared to the source terminal. Also, at x = 0.125 nm, the rate is 23.9 %, which makes it the lowest along the length of the channel; at x = 1 nm, the rate is 1.4 % lesser than that of the drain terminal. A 1.4 A/mm

conclusionThe findings of this study reveal that the proposed cylindrical structures transistor, compared to the conventional transistor, not only occupies a smaller area but also demonstrates enhanced efficiency in RF applications. These results suggest the potential for patentable innovations in the field of transistor design and fabrication, offering opportunities for intellectual property development and commercialization.

Indexed as

Arbitrary alloysCSDG MOSFEThigh-ƙ dielectricslow power/energymicroelectronicsnanomaterialssemiconductorsVLSI.

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.