Evidence map›Paper›PMID 37049347›Full record

ArticleNanomaterials (Basel, Switzerland)2023

Effect of Nanographene Coating on the Seebeck Coefficient of Mesoporous Silicon.

Sibel Nar, Arnaud Stolz, Denis Machon, Eric Bourhis, Pascal Andreazza, Abderraouf Boucherif, Nadjib Semmar

Open access · goldAbstract read
In one paragraph

Article in Nanomaterials (Basel, Switzerland), 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
0.4field-weighted citation impact, top 50% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed, 4 citations in OpenAlex.

  1. Nanostructured Oxide (SnOMicromachines · 2024
    Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

7 authors at 3 institutions in 2 countries.

Sibel NarGroupe de Recherches sur l'Énergétique des Milieux Ionisés, GREMI, Université d'Orléans, CNRS, 14 Rue d'Issoudun, 45067 Orleans CEDEX 02, France.ORCID 0000-0002-4699-7876
Arnaud StolzGroupe de Recherches sur l'Énergétique des Milieux Ionisés, GREMI, Université d'Orléans, CNRS, 14 Rue d'Issoudun, 45067 Orleans CEDEX 02, France.
Denis MachonLaboratoire Nanotechnologies et Nanosystèmes (LN2)-CNRS IRL-3463, Université de Sherbrooke, 3000 Boulevard Université, Sherbrooke, QC J1K OA5, Canada.
Eric BourhisInterfaces, Confinement, Matériaux et Nanostructures, ICMN, Université d'Orléans, CNRS, 1B, Rue de la Férollerie, 45071 Orleans CEDEX 02, France.
Pascal AndreazzaInterfaces, Confinement, Matériaux et Nanostructures, ICMN, Université d'Orléans, CNRS, 1B, Rue de la Férollerie, 45071 Orleans CEDEX 02, France.
Abderraouf BoucherifLaboratoire Nanotechnologies et Nanosystèmes (LN2)-CNRS IRL-3463, Université de Sherbrooke, 3000 Boulevard Université, Sherbrooke, QC J1K OA5, Canada.
Nadjib SemmarGroupe de Recherches sur l'Énergétique des Milieux Ionisés, GREMI, Université d'Orléans, CNRS, 14 Rue d'Issoudun, 45067 Orleans CEDEX 02, France.ORCID 0000-0002-4218-0156
Université d'Orléans · FRUniversité Claude Bernard Lyon 1 · FRUniversité de Sherbrooke · CA

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Nanographene-mesoporous silicon (G-PSi) composites have recently emerged as a promising class of nanomaterials with tuneable physical properties. In this study, we investigated the impact of nanographene coating on the Seebeck coefficient of mesoporous silicon (PSi) obtained by varying two parameters: porosity and thickness. To achieve this, an electrochemical etching process on p + doped Si is presented for the control of the parameters (thicknesses varying from 20 to 160 µm, and a porosity close to 50%), and for nanographene incorporation through chemical vapor deposition. Raman and XPS spectroscopies confirmed the presence of nanographene on PSi. Using a homemade ZT meter, the Seebeck coefficient of the p + doped Si matrix was evaluated at close to 100 ± 15 µV/K and confirmed by UPS spectroscopy analysis. Our findings suggest that the Seebeck coefficient of the porous Si can be measured independently from that of the substrate by fitting measurements on samples with a different thickness of the porous layer. The value of the Seebeck coefficient for the porous Si is of the order of 750 ± 40 µV/K. Furthermore, the incorporation of nanographene induced a drastic decrease to approximately 120 ± 15 µV/K, a value similar to that of its silicon substrate.

Indexed as

electrochemical etchingmesoporous siliconnanographene incorporationSeebeck coefficient

Identifiers

PMID37049347
PMCPMC10097016
OpenAlexW4362585399

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.