ArticleJournal of applied crystallography2023
An inclined detector geometry for improved X-ray total scattering measurements.
Article in Journal of applied crystallography, 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 5 papers.
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5 citing papers in PubMed.
- Machine learning approaches for crystallographic classification from synthetic 2D X-ray diffraction data.Journal of applied crystallography · 2026Article
- Article
- The High Energy diffraction beamline at the Canadian Light Source.Journal of synchrotron radiation · 2025Article
- xrdPlanner: exploring area detector geometries for powder diffraction and total scattering experiments.Journal of synchrotron radiation · 2024Article
- Mechanical Exfoliation of Expanded Graphite to Graphene-Based Materials and Modification with Palladium Nanoparticles for Hydrogen Storage.Nanomaterials (Basel, Switzerland) · 2023Article
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5 authors.
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Abstract
X-ray total scattering measurements are implemented using a digital flat-panel area detector in an inclined geometry and compared with the traditional geometry. The traditional geometry is defined here by the incident X-ray beam impinging on and normal to the center-most pixel of a detector. The inclined geometry is defined here by a detector at a pitch angle α, set to 15° in this case, bisected by the vertical scattering plane. The detector is positioned such that the incident X-ray beam strikes the pixels along the bottom edge and 90° scattered X-rays impinge on the pixels along the top edge. The geometric attributes of the inclined geometry translate into multiple benefits, such as an extension of the measurable scattering range to 90°, a 47% increase in the accessible magnitudes of the reciprocal-space vector
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