Evidence map›Paper›PMID 36839025›Full record

ArticleNanomaterials (Basel, Switzerland)2023

Lateral Controlled Doping and Defect Engineering of Graphene by Ultra-Low-Energy Ion Implantation.

Felix Junge, Manuel Auge, Zviadi Zarkua, Hans Hofsäss

Open access · goldAbstract read
In one paragraph

Article in Nanomaterials (Basel, Switzerland), 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
0.9field-weighted citation impact, top 33% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed, 9 citations in OpenAlex.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors at 2 institutions in 2 countries.

Felix JungeII. Institute of Physics, Georg-August-Universität Göttingen, 37077 Göttingen, Germany.ORCID 0000-0003-0620-8008
Manuel AugeII. Institute of Physics, Georg-August-Universität Göttingen, 37077 Göttingen, Germany.
Zviadi ZarkuaQuantum Solid State Physics, KU Leuven, 3001 Leuven, Belgium.
Hans HofsässII. Institute of Physics, Georg-August-Universität Göttingen, 37077 Göttingen, Germany.
University of Göttingen · DEKU Leuven · BE

Funding

Deutsche Forschungsgemeinschaft DFG-G Ho 1125/29
6 · The paper itself

Abstract

In this paper, the effectiveness of ultra-low-energy ion implantation as a means of defect engineering in graphene was explored through the measurement of Scanning Kelvin Probe Microscopy (SKPM) and Raman spectroscopy, with boron (B) and helium (He) ions being implanted into monolayer graphene samples. We used electrostatic masks to create a doped and non-doped region in one single implantation step. For verification we measured the surface potential profile along the sample and proved the feasibility of lateral controllable doping. In another experiment, a voltage gradient was applied across the graphene layer in order to implant helium at different energies and thus perform an ion-energy-dependent investigation of the implantation damage of the graphene. For this purpose Raman measurements were performed, which show the different damage due to the various ion energies. Finally, ion implantation simulations were conducted to evaluate damage formation.

Indexed as

2D materialsgrapheneIMINTDYNion implantationion implantation simulations

Identifiers

PMID36839025
PMCPMC9964514
OpenAlexW4319596618

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.