Evidence map›Paper›PMID 36772645›Full record

ArticleSensors (Basel, Switzerland)2023

Phase Deflectometry for Defect Detection of High Reflection Objects.

Xian-Ming Cheng, Ting-Ting Wang, Wen-Bin Zhu, Bai-Di Shi, Wei Chen

Abstract read
In one paragraph

Article in Sensors (Basel, Switzerland), 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Article
  2. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

5 authors.

Xian-Ming ChengCollege of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China.
Ting-Ting WangCollege of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China.ORCID 0000-0002-8615-2034
Wen-Bin ZhuCollege of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China.
Bai-Di ShiCollege of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China.
Wei ChenCollege of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China.

Funding

Changzhou Science and Technology Support & Social Development Project CE20195021National Natural Science Foundation of China 61873086
6 · The paper itself

Abstract

A method for detecting the surface defects of high reflection objects using phase deflection is proposed. The abrupt change in the surface gradient at the defect leads to the change in the fringe phase. Therefore, Gray code combined with a four-step phase-shift method was employed to obtain the surface gradients to characterize the defects. Then, through the double surface illumination model, the relationship between illumination intensity and phase was established. The causes of periodic error interference were analyzed, and the method of adjusting the fringe width to eliminate it was proposed. Finally, experimental results showed the effectiveness of the proposed method.

Indexed as

double surfacephase deflectionsurface gradients

Identifiers

PMID36772645
PMCPMC9922010

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.