Evidence map›Paper›PMID 36770397›Full record

ArticleNanomaterials (Basel, Switzerland)2023

UV-Nanoimprint and Deep Reactive Ion Etching of High Efficiency Silicon Metalenses: High Throughput at Low Cost with Excellent Resolution and Repeatability.

Christopher A Dirdal, Karolina Milenko, Anand Summanwar, Firehun T Dullo, Paul C V Thrane, Oana Rasoga, Andrei M Avram, Adrian Dinescu, Angela M Baracu

Abstract read
In one paragraph

Article in Nanomaterials (Basel, Switzerland), 2023. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 5 papers.

0numbers the graph read from it
0cells of the map it votes in
5citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

5 citing papers in PubMed.

  1. Review
  2. Article
  3. Review
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4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

9 authors.

Christopher A DirdalSINTEF Microsystems and Nanotechnology, Gaustadalleen 23C, 0737 Oslo, Norway.ORCID 0000-0002-9632-3239
Karolina MilenkoSINTEF Microsystems and Nanotechnology, Gaustadalleen 23C, 0737 Oslo, Norway.
Anand SummanwarSINTEF Microsystems and Nanotechnology, Gaustadalleen 23C, 0737 Oslo, Norway.
Firehun T DulloSINTEF Microsystems and Nanotechnology, Gaustadalleen 23C, 0737 Oslo, Norway.
Paul C V ThraneSINTEF Microsystems and Nanotechnology, Gaustadalleen 23C, 0737 Oslo, Norway.ORCID 0000-0001-5296-2912
Oana RasogaNational Institute of Materials Physics, Atomistilor Street 405 A, 077125 Magurele, Romania.ORCID 0000-0002-7901-0361
Andrei M AvramNational Institute for Research and Development in Microtechnologies-IMT Bucharest, Erou Iancu Nicolae Street 126A, 077190 Voluntari, Romania.ORCID 0000-0003-0315-6599
Adrian DinescuNational Institute for Research and Development in Microtechnologies-IMT Bucharest, Erou Iancu Nicolae Street 126A, 077190 Voluntari, Romania.
Angela M BaracuNational Institute for Research and Development in Microtechnologies-IMT Bucharest, Erou Iancu Nicolae Street 126A, 077190 Voluntari, Romania.ORCID 0000-0002-5791-1548

Funding

EEA Financial Mechanism 2014-2021 EEA-RO-NO2018-0438 - ElastoMETA
6 · The paper itself

Abstract

As metasurfaces begin to find industrial applications there is a need to develop scalable and cost-effective fabrication techniques which offer sub-100 nm resolution while providing high throughput and large area patterning. Here we demonstrate the use of UV-Nanoimprint Lithography and Deep Reactive Ion Etching (Bosch and Cryogenic) towards this goal. Robust processes are described for the fabrication of silicon rectangular pillars of high pattern fidelity. To demonstrate the quality of the structures, metasurface lenses, which demonstrate diffraction limited focusing and close to theoretical efficiency for NIR wavelengths λ ∈ (1.3 μm, 1.6 μm), are fabricated. We demonstrate a process which removes the characteristic sidewall surface roughness of the Bosch process, allowing for smooth 90-degree vertical sidewalls. We also demonstrate that the optical performance of the metasurface lenses is not affected adversely in the case of Bosch sidewall surface roughness with 45 nm indentations (or scallops). Next steps of development are defined for achieving full wafer coverage.

Indexed as

metasurfacesnanopatterningphotonic sensors

Identifiers

PMID36770397
PMCPMC9920157

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.