Evidence map›Paper›PMID 36504734›Full record

ArticleNanoscale advances2022

Uniform self-rectifying resistive random-access memory based on an MXene-TiO

Chao Zang, Bo Li, Yun Sun, Shun Feng, Xin-Zhe Wang, Xiaohui Wang, Dong-Ming Sun

Abstract read
In one paragraph

Article in Nanoscale advances, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed.

  1. Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

7 authors.

Chao ZangShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences 72 Wenhua Road Shenyang 110016 China yunsun@imr.ac.cn wang@imr.ac.cn dmsun@imr.ac.cn.
Bo LiShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences 72 Wenhua Road Shenyang 110016 China yunsun@imr.ac.cn wang@imr.ac.cn dmsun@imr.ac.cn.
Yun SunShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences 72 Wenhua Road Shenyang 110016 China yunsun@imr.ac.cn wang@imr.ac.cn dmsun@imr.ac.cn.
Shun FengShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences 72 Wenhua Road Shenyang 110016 China yunsun@imr.ac.cn wang@imr.ac.cn dmsun@imr.ac.cn.
Xin-Zhe WangShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences 72 Wenhua Road Shenyang 110016 China yunsun@imr.ac.cn wang@imr.ac.cn dmsun@imr.ac.cn.
Xiaohui WangShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences 72 Wenhua Road Shenyang 110016 China yunsun@imr.ac.cn wang@imr.ac.cn dmsun@imr.ac.cn.ORCID https://orcid.org/0000-0001-7271-2662
Dong-Ming SunShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences 72 Wenhua Road Shenyang 110016 China yunsun@imr.ac.cn wang@imr.ac.cn dmsun@imr.ac.cn.ORCID https://orcid.org/0000-0003-1552-7940

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

For filamentary resistive random-access memory (RRAM) devices, the switching behavior between different resistance states usually occurs abruptly, while the random formation of conductive filaments usually results in large fluctuations in resistance states, leading to poor uniformity. Schottky barrier modulation enables resistive switching through charge trapping/de-trapping at the top-electrode/oxide interface, which is effective for improving the uniformity of RRAM devices. Here, we report a uniform RRAM device based on a MXene-TiO

Identifiers

PMID36504734
PMCPMC9680946

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.