ArticleMolecules (Basel, Switzerland)2022
Deposition Mechanism and Properties of Plasma-Enhanced Atomic Layer Deposited Gallium Nitride Films with Different Substrate Temperatures.
Fang-Bin Ren, Shi-Cong Jiang, Chia-Hsun Hsu, Xiao-Ying Zhang, Peng Gao, Wan-Yu Wu, Yi-Jui Chiu, Shui-Yang Lien, Wen-Zhang Zhu
Abstract read
In one paragraphArticle in Molecules (Basel, Switzerland), 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from itWhat it found
Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.
The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
2 · The registryThe trial behind it
Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.
Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.
3 · Its place in the literatureWho cites it
0 citing papers in PubMed.
No citing paper in PubMed yet.
4 · The recordCorrections and comments
PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.
5 · Who and what moneyAuthors and funding
9 authors.
Fang-Bin RenXiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology, School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.
Shi-Cong JiangXiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology, School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.
Chia-Hsun HsuXiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology, School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.
Xiao-Ying ZhangXiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology, School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.
Peng GaoFujian Provincial Key Laboratory of Nanomaterials, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou 350002, China.ORCID 0000-0002-4963-2282 Wan-Yu WuDepartment of Materials Science and Engineering, National United University, Miaoli 36063, Taiwan.
Yi-Jui ChiuSchool of Mechanical and Automotive Engineering, Xiamen University of Technology, Xiamen 361024, China.ORCID 0000-0001-5632-9321 Shui-Yang LienXiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology, School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.
Wen-Zhang ZhuXiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology, School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.
Funding
Educational Office of Fujian Province JT180432National Natural Science Foundation of China 21975260Natural Science Foundation of Fujian Province 2020H0025Natural Science Foundation of Fujian Province 2020J01298Science and Technology Project in Xiamen 3502ZCQ20191002Xiamen Scientific Research Strat-up Foundation for the Returned Overseas Chinese Scholars 5010320004Xiamen University of Technology 40199029Xiamen University of Technology 405011904Xiamen University of Technology HK-HX201243Xiamen University of Technology HK-HX210106Xiamen University of Technology YKJ18008R
6 · The paper itselfAbstract
Gallium nitride (GaN) is a wide bandgap semiconductor with remarkable chemical and thermal stability, making it a competitive candidate for a variety of optoelectronic applications. In this study, GaN films are grown using a plasma-enhanced atomic layer deposition (PEALD) with trimethylgallium (TMG) and NH
Indexed as
PlasmaSemiconductorsGalliumOxygenPhotoelectron SpectroscopyGalliumgallium nitrideOxygengallium nitrideplasma-enhanced atomic layer depositionsubstrate temperature
Identifiers
PMID36500217
PMCPMC9740686
What OpenQuestion holds
Textmetadata
LicenceCC BY
Read underepoch 390