Evidence map›Paper›PMID 36500217›Full record

ArticleMolecules (Basel, Switzerland)2022

Deposition Mechanism and Properties of Plasma-Enhanced Atomic Layer Deposited Gallium Nitride Films with Different Substrate Temperatures.

Fang-Bin Ren, Shi-Cong Jiang, Chia-Hsun Hsu, Xiao-Ying Zhang, Peng Gao, Wan-Yu Wu, Yi-Jui Chiu, Shui-Yang Lien, Wen-Zhang Zhu

Abstract read
In one paragraph

Article in Molecules (Basel, Switzerland), 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

9 authors.

Fang-Bin RenXiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology, School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.
Shi-Cong JiangXiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology, School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.
Chia-Hsun HsuXiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology, School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.
Xiao-Ying ZhangXiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology, School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.
Peng GaoFujian Provincial Key Laboratory of Nanomaterials, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou 350002, China.ORCID 0000-0002-4963-2282
Wan-Yu WuDepartment of Materials Science and Engineering, National United University, Miaoli 36063, Taiwan.
Yi-Jui ChiuSchool of Mechanical and Automotive Engineering, Xiamen University of Technology, Xiamen 361024, China.ORCID 0000-0001-5632-9321
Shui-Yang LienXiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology, School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.
Wen-Zhang ZhuXiamen Key Laboratory of Development and Application for Advanced Semiconductor Coating Technology, School of Opto-Electronic and Communication Engineering, Xiamen University of Technology, Xiamen 361024, China.

Funding

Educational Office of Fujian Province JT180432National Natural Science Foundation of China 21975260Natural Science Foundation of Fujian Province 2020H0025Natural Science Foundation of Fujian Province 2020J01298Science and Technology Project in Xiamen 3502ZCQ20191002Xiamen Scientific Research Strat-up Foundation for the Returned Overseas Chinese Scholars 5010320004Xiamen University of Technology 40199029Xiamen University of Technology 405011904Xiamen University of Technology HK-HX201243Xiamen University of Technology HK-HX210106Xiamen University of Technology YKJ18008R
6 · The paper itself

Abstract

Gallium nitride (GaN) is a wide bandgap semiconductor with remarkable chemical and thermal stability, making it a competitive candidate for a variety of optoelectronic applications. In this study, GaN films are grown using a plasma-enhanced atomic layer deposition (PEALD) with trimethylgallium (TMG) and NH

Indexed as

PlasmaSemiconductorsGalliumOxygenPhotoelectron SpectroscopyGalliumgallium nitrideOxygengallium nitrideplasma-enhanced atomic layer depositionsubstrate temperature

Identifiers

PMID36500217
PMCPMC9740686

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.