Evidence map›Paper›PMID 36422411›Full record

ArticleMicromachines2022

Pile-Ups Formation in AFM-Based Nanolithography: Morpho-Mechanical Characterization and Removal Strategies.

Paolo Pellegrino, Isabella Farella, Mariafrancesca Cascione, Valeria De Matteis, Alessandro Paolo Bramanti, Lorenzo Vincenti, Antonio Della Torre, Fabio Quaranta, Rosaria Rinaldi

Open access · goldAbstract read
In one paragraph

Article in Micromachines, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
0.9field-weighted citation impact, top 26% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed, 7 citations in OpenAlex.

  1. Article
  2. Review
  3. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

9 authors at 3 institutions in 1 country.

Paolo PellegrinoDepartment of Mathematics and Physics "Ennio De Giorgi", University of Salento, Via Monteroni, 73100 Lecce, Italy.ORCID 0000-0001-6018-3548
Isabella FarellaInstitute for Microelectronics and Microsystems (IMM), CNR, Via Monteroni, 73100 Lecce, Italy.ORCID 0000-0003-1939-986X
Mariafrancesca CascioneDepartment of Mathematics and Physics "Ennio De Giorgi", University of Salento, Via Monteroni, 73100 Lecce, Italy.ORCID 0000-0001-9849-5301
Valeria De MatteisDepartment of Mathematics and Physics "Ennio De Giorgi", University of Salento, Via Monteroni, 73100 Lecce, Italy.ORCID 0000-0003-2204-8817
Alessandro Paolo BramantiSTMicroelectronics S.r.l., System Research and Applications (SRA) Silicon Biotech, Lecce Labs, Via Monteroni, 73100 Lecce, Italy.ORCID 0000-0001-9266-9075
Lorenzo VincentiDepartment of Mathematics and Physics "Ennio De Giorgi", University of Salento, Via Monteroni, 73100 Lecce, Italy.ORCID 0000-0001-8797-186X
Antonio Della TorreInstitute for Microelectronics and Microsystems (IMM), CNR, Via Monteroni, 73100 Lecce, Italy.ORCID 0000-0002-2237-1115
Fabio QuarantaInstitute for Microelectronics and Microsystems (IMM), CNR, Via Monteroni, 73100 Lecce, Italy.
Rosaria RinaldiDepartment of Mathematics and Physics "Ennio De Giorgi", University of Salento, Via Monteroni, 73100 Lecce, Italy.ORCID 0000-0003-2798-9341
University of Salento · ITInstitute for Microelectronics and Microsystems · ITSTMicroelectronics (Italy) · IT

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

In recent decades, great efforts have been made to develop innovative, effective, and accurate nanofabrication techniques stimulated by the growing demand for nanostructures. Nowadays, mechanical tip-based emerged as the most promising nanolithography technique, allowing the pattern of nanostructures with a sub-nanometer resolution, high reproducibility, and accuracy. Unfortunately, these nanostructures result in contoured pile-ups that could limit their use and future integration into high-tech devices. The removal of pile-ups is still an open challenge. In this perspective, two different AFM-based approaches, i.e., Force Modulation Mode imaging and force-distance curve analysis, were used to characterize the structure of pile-ups at the edges of nanogrooves patterned on PMMA substrate by means of Pulse-Atomic Force Lithography. Our experimental results showed that the material in pile-ups was less stiff than the pristine polymer. Based on this evidence, we have developed an effective strategy to easily remove pile-ups, preserving the shape and the morphology of nanostructures.

Indexed as

atomic force microscopyatomic force-nanolithographynanomechanicspile-ups characterizationPulse-Atomic Force Nanolithography

Identifiers

PMID36422411
PMCPMC9692810
OpenAlexW4309153934

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.