Evidence map›Paper›PMID 36418420›Full record

ArticleScientific reports2022

Electron-beam patterned calibration structures for structured illumination microscopy.

Sangeetha Hari, Johan A Slotman, Yoram Vos, Christian Floris, Wiggert A van Cappellen, C W Hagen, Sjoerd Stallinga, Adriaan B Houtsmuller, Jacob P Hoogenboom

Abstract read
In one paragraph

Article in Scientific reports, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

9 authors.

Sangeetha HariImaging Physics, Delft University of Technology, Delft, The Netherlands.
Johan A SlotmanDepartment of Pathology, Erasmus Optical Imaging Centre, Erasmus Medical Center, Rotterdam, The Netherlands.
Yoram VosImaging Physics, Delft University of Technology, Delft, The Netherlands.
Christian FlorisImaging Physics, Delft University of Technology, Delft, The Netherlands.
Wiggert A van CappellenDepartment of Pathology, Erasmus Optical Imaging Centre, Erasmus Medical Center, Rotterdam, The Netherlands.
C W HagenImaging Physics, Delft University of Technology, Delft, The Netherlands.
Sjoerd StallingaImaging Physics, Delft University of Technology, Delft, The Netherlands.
Adriaan B HoutsmullerDepartment of Pathology, Erasmus Optical Imaging Centre, Erasmus Medical Center, Rotterdam, The Netherlands.
Jacob P HoogenboomImaging Physics, Delft University of Technology, Delft, The Netherlands. j.p.hoogenboom@tudelft.nl.

Funding

Nederlandse Organisatie voor Wetenschappelijk Onderzoek ECHO-711.016.003ZonMw 435002021
6 · The paper itself

Abstract

Super-resolution fluorescence microscopy can be achieved by image reconstruction after spatially patterned illumination or sequential photo-switching and read-out. Reconstruction algorithms and microscope performance are typically tested using simulated image data, due to a lack of strategies to pattern complex fluorescent patterns with nanoscale dimension control. Here, we report direct electron-beam patterning of fluorescence nanopatterns as calibration standards for super-resolution fluorescence. Patterned regions are identified with both electron microscopy and fluorescence labelling of choice, allowing precise correlation of predefined pattern dimensions, a posteriori obtained electron images, and reconstructed super-resolution images.

Indexed as

ElectronsLightingAlgorithmsCalibrationMicroscopy, Fluorescence

Identifiers

PMID36418420
PMCPMC9684522

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.