Evidence map›Paper›PMID 36364540›Full record

ArticleNanomaterials (Basel, Switzerland)2022

Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples.

Steffen Staeck, Anna Andrle, Philipp Hönicke, Jonas Baumann, Daniel Grötzsch, Jan Weser, Gesa Goetzke, Adrian Jonas, Yves Kayser, Frank Förste and 6 more

Open access · goldAbstract read
In one paragraph

Article in Nanomaterials (Basel, Switzerland), 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.

0numbers the graph read from it
0cells of the map it votes in
0citing papers in PubMed
3.2field-weighted citation impact, top 9% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

0 citing papers in PubMed, 12 citations in OpenAlex.

No citing paper in PubMed yet.

4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

16 authors at 3 institutions in 1 country.

Steffen StaeckTU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany.
Anna AndrlePhysikalisch-Technische Bundesanstalt, 10587 Berlin, Germany.ORCID 0000-0001-6459-5208
Philipp HönickeTU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany.ORCID 0000-0002-0712-903X
Jonas BaumannTU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany.ORCID 0000-0002-1085-9527
Daniel GrötzschTU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany.
Jan WeserPhysikalisch-Technische Bundesanstalt, 10587 Berlin, Germany.
Gesa GoetzkeTU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany.
Adrian JonasTU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany.
Yves KayserPhysikalisch-Technische Bundesanstalt, 10587 Berlin, Germany.ORCID 0000-0002-0301-2918
Frank FörsteTU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany.
Ioanna MantouvalouHelmholtz-Zentrum Berlin, 12489 Berlin, Germany.ORCID 0000-0002-9696-2970
Jens ViefhausHelmholtz-Zentrum Berlin, 12489 Berlin, Germany.
Victor SoltwischPhysikalisch-Technische Bundesanstalt, 10587 Berlin, Germany.ORCID 0000-0001-8469-8589
Holger StielMax-Born-Institut, 12489 Berlin, Germany.
Burkhard BeckhoffPhysikalisch-Technische Bundesanstalt, 10587 Berlin, Germany.
Birgit KanngießerTU Berlin, Analytical X-ray Physics, 10623 Berlin, Germany.
Technische Universität Berlin · DEPhysikalisch-Technische Bundesanstalt · DEHelmholtz-Zentrum Berlin für Materialien und Energie · DE

Funding

ECSEL JU IT2 875999
6 · The paper itself

Abstract

Scan-free grazing-emission X-ray fluorescence spectroscopy (GEXRF) is an established technique for the investigation of the elemental depth-profiles of various samples. Recently it has been applied to investigating structured nanosamples in the tender X-ray range. However, lighter elements such as oxygen, nitrogen or carbon cannot be efficiently investigated in this energy range, because of the ineffective excitation. Moreover, common CCD detectors are not able to discriminate between fluorescence lines below 1 keV. Oxygen and nitrogen are important components of insulation and passivation layers, for example, in silicon oxide or silicon nitride. In this work, scan-free GEXRF is applied in proof-of-concept measurements for the investigation of lateral ordered 2D nanostructures in the soft X-ray range. The sample investigated is a Si3N4 lamellar grating, which represents 2D periodic nanostructures as used in the semiconductor industry. The emerging two-dimensional fluorescence patterns are recorded with a CMOS detector. To this end, energy-dispersive spectra are obtained via single-photon event evaluation. In this way, spatial and therefore angular information is obtained, while discrimination between different photon energies is enabled. The results are compared to calculations of the sample model performed by a Maxwell solver based on the finite-elements method. A first measurement is carried out at the UE56-2 PGM-2 beamline at the BESSY II synchrotron radiation facility to demonstrate the feasibility of the method in the soft X-ray range. Furthermore, a laser-produced plasma source (LPP) is utilized to investigate the feasibility of this technique in the laboratory. The results from the BESSY II measurements are in good agreement with the simulations and prove the applicability of scan-free GEXRF in the soft X-ray range for quality control and process engineering of 2D nanostructures. The LPP results illustrate the chances and challenges concerning a transfer of the methodology to the laboratory.

Indexed as

GEXRFperiodic nanostructuressoft X-ray

Identifiers

PMID36364540
PMCPMC9658930
OpenAlexW4307547648

What OpenQuestion holds

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LicenceCC BY
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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.