Evidence map›Paper›PMID 36363890›Full record

ArticleMicromachines2022

Conduction Mechanism Analysis of Abrupt- and Gradual-Switching InGaZnO Memristors.

Woo Sik Choi, Min Suk Song, Hyungjin Kim, Dae Hwan Kim

Abstract read
In one paragraph

Article in Micromachines, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.

0numbers the graph read from it
0cells of the map it votes in
4citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

4 citing papers in PubMed.

  1. Article
  2. Review
  3. Article
  4. Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Woo Sik ChoiSchool of Electrical Engineering, Kookmin University, Seoul 02707, Korea.
Min Suk SongDepartment of Electronic Engineering, Inha University, Incheon 22212, Korea.ORCID 0000-0003-0915-2572
Hyungjin KimDepartment of Electronic Engineering, Inha University, Incheon 22212, Korea.ORCID 0000-0002-4834-6882
Dae Hwan KimSchool of Electrical Engineering, Kookmin University, Seoul 02707, Korea.ORCID 0000-0003-2567-4012

Funding

Institute for Information and Communications Technology Promotion 2021-0-01764National Research Foundation of Korea 2016R1A5A1012966, 2020R1A2B5B01001979, 2022M3I7A1085471
6 · The paper itself

Abstract

In this work, two types of InGaZnO (IGZO) memristors were fabricated to confirm the conduction mechanism and degradation characteristics of memristors with different electrode materials. The IGZO memristor exhibits abrupt switching characteristics with the Pd electrode owing to the formation and destruction of conductive filaments but shows gradual switching characteristics with the p-type Si electrode according to the amount of generated oxygen vacancy. The electrical characteristics and conduction mechanisms of the device are analyzed using an energy band diagram and experimentally verified with random telegraph noise characteristics confirming the trap effects on the device conduction.

Indexed as

conduction mechanismgradual and abrupt switchingInGaZnOmemristoroxygen vacancyrandom telegraph noise

Identifiers

PMID36363890
PMCPMC9697067

What OpenQuestion holds

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LicenceCC BY
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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.