ArticleJournal of synchrotron radiation2022
Two-dimensional speckle technique for slope error measurements of weakly focusing reflective X-ray optics.
Article in Journal of synchrotron radiation, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.
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Who cites it
3 citing papers in PubMed.
- Progress in the Fabrication and Optimization of High-Energy Diamond X-Ray Refractive Lenses.Micromachines · 2026Review
- Spexwavepy: an open-source Python package for X-ray wavefront sensing using speckle-based techniques.Journal of synchrotron radiation · 2024Article
- Passive doubly curved structures for determining clamping forces applied to X-ray optic assemblies.Journal of synchrotron radiation · 2023Article
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4 authors.
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Abstract
Speckle-based at-wavelength metrology techniques now play an important role in X-ray wavefront measurements. However, for reflective X-ray optics, the majority of existing speckle-based methods fail to provide reliable 2D information about the optical surface being characterized. Compared with the 1D information typically output from speckled-based methods, a 2D map is more informative for understanding the overall quality of the optic being tested. In this paper, we propose a method for in situ 2D absolute metrology of weakly focusing X-ray mirrors. Importantly, the angular misalignment of the mirror can be easily corrected with the proposed 2D processing procedure. We hope the speckle pattern data processing method presented here will help to extend this technique to wider applications in the synchrotron radiation and X-ray free-electron laser communities.
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