Evidence map›Paper›PMID 36329041›Full record

ArticleScientific reports2022

High-dose X-ray radiation induced MgO degradation and breakdown in spin transfer torque magnetic tunnel junctions.

Qi He, Hui Shi, Yinquan Wang, Lichao Cao, Xiang Gu, Jianwei Wu, Genshen Hong, Minghua Li

Open access · goldAbstract read
In one paragraph

Article in Scientific reports, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
0.4field-weighted citation impact, top 49% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed, 9 citations in OpenAlex.

  1. Article
  2. Shaping Perpendicular Magnetic Anisotropy of CoSensors (Basel, Switzerland) · 2023
    Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

8 authors at 2 institutions in 1 country.

Qi HeThe 58th Research Institute, China Electronics Technology Group Corporation, Wuxi, 214072, China.
Hui ShiThe 58th Research Institute, China Electronics Technology Group Corporation, Wuxi, 214072, China.
Yinquan WangThe 58th Research Institute, China Electronics Technology Group Corporation, Wuxi, 214072, China.
Lichao CaoThe 58th Research Institute, China Electronics Technology Group Corporation, Wuxi, 214072, China.
Xiang GuThe 58th Research Institute, China Electronics Technology Group Corporation, Wuxi, 214072, China.
Jianwei WuThe 58th Research Institute, China Electronics Technology Group Corporation, Wuxi, 214072, China.
Genshen HongThe 58th Research Institute, China Electronics Technology Group Corporation, Wuxi, 214072, China.
Minghua LiDepartment of Material Physics and Chemistry, School of Material Science and Engineering, University of Science and Technology Beijing, Beijing, 100083, China. mhli@ustb.edu.cn.
China Electronics Technology Group Corporation · CNUniversity of Science and Technology Beijing · CN

Funding

Beijing Natural Science Foundation 2182037National Key Research and Development Program of China 2019YFB1309900
6 · The paper itself

Abstract

Magnetic tunnel junction (MTJ) with magnesium oxide (MgO) tunnel barrier is the core element of spin transfer torque-based magnetic random access memory. For the application in the space environment, the total ionizing dose radiation effects on MTJs need to be evaluated. In this work, the MTJs were exposed to X-ray radiation with different doses of up to 10 Mrad(Si). Measurements of current induced magnetization switching (CIMS) behavior of these MTJs were performed before and after radiation. The results show negligible changes in the tunneling magnetoresistance and current switching properties after 8 Mrad(Si) X-ray radiation. However, with a total dose of 9 Mrad(Si), a significant reduction in junction resistance of a fairly large number of MTJs was observed, which showed characteristics of MTJ breakdown. Moreover, in this study, all experimental MTJs became functionally disabled due to MgO breakdown under 10 Mrad(Si) X-ray radiation. The CoFeB/MgO/CoFeB interface microstructure was observed using X-ray photoelectron spectroscopy and high-resolution transmission electron microscopy (HRTEM). Interfacial structural results indicate that the MgO degradation and breakdown behavior caused by X-ray ionizing radiation can give rise to radiation-induced oxygen vacancies across the tunnel barrier oxide layer.

Identifiers

PMID36329041
PMCPMC9633594
OpenAlexW4308045336

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.