Evidence map›Paper›PMID 36321140›Full record

ArticleNanoscale advances2022

Reliable metal-graphene contact formation process flows in a CMOS-compatible environment.

M Elviretti, M Lisker, R Lukose, M Lukosius, F Akhtar, A Mai

Abstract read
In one paragraph

Article in Nanoscale advances, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Article
  2. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

6 authors.

M ElvirettiIHP Im Technologiepark 25 15236 Frankfurt (Oder) Germany elviretti@ihp-microelectronics.com +49 335 5625 300 +49 335 5625 346.ORCID https://orcid.org/0000-0002-6047-3040
M LiskerIHP Im Technologiepark 25 15236 Frankfurt (Oder) Germany elviretti@ihp-microelectronics.com +49 335 5625 300 +49 335 5625 346.
R LukoseIHP Im Technologiepark 25 15236 Frankfurt (Oder) Germany elviretti@ihp-microelectronics.com +49 335 5625 300 +49 335 5625 346.
M LukosiusIHP Im Technologiepark 25 15236 Frankfurt (Oder) Germany elviretti@ihp-microelectronics.com +49 335 5625 300 +49 335 5625 346.
F AkhtarIHP Im Technologiepark 25 15236 Frankfurt (Oder) Germany elviretti@ihp-microelectronics.com +49 335 5625 300 +49 335 5625 346.
A MaiIHP Im Technologiepark 25 15236 Frankfurt (Oder) Germany elviretti@ihp-microelectronics.com +49 335 5625 300 +49 335 5625 346.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

The possibility of exploiting the enormous potential of graphene for microelectronics and photonics must go through the optimization of the graphene-metal contact. Achieving low contact resistance is essential for the consideration of graphene as a candidate material for electronic and photonic devices. This work has been carried out in an 8'' wafer pilot-line for the integration of graphene into a CMOS environment. The main focus is to study the impact of the patterning of graphene and passivation on metal-graphene contact resistance. The latter is measured by means of transmission line measurement (TLM) with several contact designs. The presented approaches enable reproducible formation of contact resistivity as low as 660 Ω μm with a sheet resistance of 1.8 kΩ/□ by proper graphene patterning, passivation of the channel and a post-processing treatment such as annealing.

Identifiers

PMID36321140
PMCPMC9552920

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.