Evidence map›Paper›PMID 36057011›Full record

ArticleNanoscale research letters2022

Multi-level Cells and Quantized Conductance Characteristics of Al

Yunseok Lee, Jongmin Park, Daewon Chung, Kisong Lee, Sungjun Kim

Abstract read
In one paragraph

Article in Nanoscale research letters, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 9 papers.

0numbers the graph read from it
0cells of the map it votes in
9citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

9 citing papers in PubMed.

  1. Article
  2. Article
  3. Article
  4. Review
  5. Article
  6. Improved Uniformity of TaOMaterials (Basel, Switzerland) · 2023
    Article
  7. Article
  8. Article
  9. Resistive Switching Characteristics of Alloyed AlSiOMaterials (Basel, Switzerland) · 2022
    Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

5 authors.

Yunseok LeeDivision of Electronics and Electrical Engineering, Dongguk University, Seoul, 04620, Republic of Korea.
Jongmin ParkDivision of Electronics and Electrical Engineering, Dongguk University, Seoul, 04620, Republic of Korea.
Daewon ChungDivision of Electronics and Electrical Engineering, Dongguk University, Seoul, 04620, Republic of Korea.
Kisong LeeDepartment of Information and Communication Engineering, Dongguk University, Seoul, 04620, Republic of Korea.
Sungjun KimDivision of Electronics and Electrical Engineering, Dongguk University, Seoul, 04620, Republic of Korea. sungjun@dongguk.edu.

Funding

Sungjun Kim NRF 2021R1C1C1004422
6 · The paper itself

Abstract

Recently, various resistance-based memory devices are being studied to replace charge-based memory devices to satisfy high-performance memory requirements. Resistance random access memory (RRAM) shows superior performances such as fast switching speed, structural scalability, and long retention. This work presented the different filament control by the DC voltages and verified its characteristics as a synaptic device by pulse measurement. Firstly, two current-voltage (I-V) curves are characterized by controlling a range of DC voltages. The retention and endurance for each different I-V curve were measured to prove the reliability of the RRAM device. The detailed voltage manipulation confirmed the characteristics of multi-level cell (MLC) and conductance quantization. Lastly, synaptic functions such as potentiation and depression, paired-pulse depression, excitatory post-synaptic current, and spike-timing-dependent plasticity were verified. Collectively, we concluded that Pt/Al

Indexed as

Al2O3MemristorMLCNeuromorphic systemQuantized conductance

Identifiers

PMID36057011
PMCPMC9440974

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.