Evidence map›Paper›PMID 35888892›Full record

ArticleMicromachines2022

Bond Wire Damage Detection Method on Discrete MOSFETs Based on Two-Port Network Measurement.

Minghui Yun, Miao Cai, Daoguo Yang, Yiren Yang, Jing Xiao, Guoqi Zhang

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Micromachines, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Review
  2. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

6 authors.

Minghui YunSchool of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, Guilin 541004, China.ORCID 0000-0001-6310-7946
Miao CaiSchool of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, Guilin 541004, China.ORCID 0000-0001-5836-0998
Daoguo YangSchool of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, Guilin 541004, China.
Yiren YangSchool of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, Guilin 541004, China.
Jing XiaoSchool of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, Guilin 541004, China.
Guoqi ZhangSchool of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, Guilin 541004, China.

Funding

Guilin Science Research and Technology Development Program No. 2020010302, No. 2021021002, and No. 2021020504Innovation-Driven Development Project of Guangxi Province No. AA182420Innovation Project of GUET Graduate Education No. 2021YCXB01 and No. 2022YCXS018Key R & D Plan Project of Guangxi Province No. GuiKe AB20159038National Natural Science Foundation of China No. 61865004, and No. 62164004
6 · The paper itself

Abstract

Bond wire damage is one of the most common failure modes of metal-oxide semiconductor field-effect transistor (MOSFET) power devices in wire-welded packaging. This paper proposes a novel bond wire damage detection approach based on two-port network measurement by identifying the MOSFET source parasitic inductance (

Indexed as

bond wire faultMOSFETsource parasitic inductancetwo-port network

Identifiers

PMID35888892
PMCPMC9324417

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.