Evidence map›Paper›PMID 35888248›Full record

ReviewMaterials (Basel, Switzerland)2022

Research Progress of p-Type Oxide Thin-Film Transistors.

Zhuping Ouyang, Wanxia Wang, Mingjiang Dai, Baicheng Zhang, Jianhong Gong, Mingchen Li, Lihao Qin, Hui Sun

Open access · goldAbstract readReview
In one paragraph

Review in Materials (Basel, Switzerland), 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
3.2field-weighted citation impact, top 7% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed, 41 citations in OpenAlex.

  1. Article
  2. Article
  3. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

8 authors at 3 institutions in 1 country.

Zhuping OuyangSchool of Space Science and Physics, Shandong University, Weihai 264209, China.
Wanxia WangSchool of Mechanical, Electrical and Information Engineering, Shandong University, Weihai 264200, China.
Mingjiang DaiGuangdong Provincial Key Laboratory of Modern Surface Engineering Technology, Institute of New Materials, Guangdong Academy of Sciences, Guangzhou 510651, China.
Baicheng ZhangBeijing Advanced Innovation Center Materials Genome Engineering, Advanced Material & Technology Institute, University of Science and Technology Beijing, Beijing 100083, China.
Jianhong GongSchool of Mechanical, Electrical and Information Engineering, Shandong University, Weihai 264200, China.
Mingchen LiSchool of Space Science and Physics, Shandong University, Weihai 264209, China.
Lihao QinSchool of Space Science and Physics, Shandong University, Weihai 264209, China.ORCID 0000-0002-5109-0566
Hui SunSchool of Space Science and Physics, Shandong University, Weihai 264209, China.
Shandong University · CNGuangdong Academy of Sciences · CNUniversity of Science and Technology Beijing · CN

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

The development of transparent electronics has advanced metal-oxide-semiconductor Thin-Film transistor (TFT) technology. In the field of flat-panel displays, as basic units, TFTs play an important role in achieving high speed, brightness, and screen contrast ratio to display information by controlling liquid crystal pixel dots. Oxide TFTs have gradually replaced silicon-based TFTs owing to their field-effect mobility, stability, and responsiveness. In the market, n-type oxide TFTs have been widely used, and their preparation methods have been gradually refined; however, p-Type oxide TFTs with the same properties are difficult to obtain. Fabricating p-Type oxide TFTs with the same performance as n-type oxide TFTs can ensure more energy-efficient complementary electronics and better transparent display applications. This paper summarizes the basic understanding of the structure and performance of the p-Type oxide TFTs, expounding the research progress and challenges of oxide transistors. The microstructures of the three types of p-Type oxides and significant efforts to improve the performance of oxide TFTs are highlighted. Finally, the latest progress and prospects of oxide TFTs based on p-Type oxide semiconductors and other p-Type semiconductor electronic devices are discussed.

Indexed as

cuprous oxidenickel oxideorbital hybridoxide Thin-Film transistorspreparation technologytin oxide

Identifiers

PMID35888248
PMCPMC9323180
OpenAlexW4285013252

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.