Evidence map›Paper›PMID 35869131›Full record

ArticleScientific reports2022

End-to-end deep learning framework for printed circuit board manufacturing defect classification.

Abhiroop Bhattacharya, Sylvain G Cloutier

Abstract read
In one paragraph

Article in Scientific reports, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 19 papers, 1 of them a synthesis that pooled it.

0numbers the graph read from it
0cells of the map it votes in
19citing papers in PubMed, 1 pooled it
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

19 citing papers in PubMed, 1 synthesis or guideline pooled it.

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4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

2 authors.

Abhiroop BhattacharyaDepartment of Electrical Engineering, École de technologie supérieure, 1100 Notre-Dame Ouest, Montreal, QC, H3C 1K3, Canada.
Sylvain G CloutierDepartment of Electrical Engineering, École de technologie supérieure, 1100 Notre-Dame Ouest, Montreal, QC, H3C 1K3, Canada. SylvainG.Cloutier@etsmtl.ca.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

We report a complete deep-learning framework using a single-step object detection model in order to quickly and accurately detect and classify the types of manufacturing defects present on Printed Circuit Board (PCBs). We describe the complete model architecture and compare with the current state-of-the-art using the same PCB defect dataset. These benchmark methods include the Faster Region Based Convolutional Neural Network (FRCNN) with ResNet50, RetinaNet, and You-Only-Look-Once (YOLO) for defect detection and identification. Results show that our method achieves a 98.1% mean average precision(mAP[IoU = 0.5]) on the test samples using low-resolution images. This is 3.2% better than the state-of-the-art using low-resolution images (YOLO V5m) and 1.4% better than the state-of-the-art using high-resolution images (FRCNN-ResNet FPN). While achieving better accuracies, our model also requires roughly 3× fewer model parameters (7.02M) compared with the state-of-the-art FRCNN-ResNet FPN (23.59M) and YOLO V5m (20.08M). In most cases, the major bottleneck of the PCB manufacturing chain is quality control, reliability testing and manual rework of defective PCBs. Based on the initial results, we firmly believe that implementing this model on a PCB manufacturing line could significantly increase the production yield and throughput, while dramatically reducing manufacturing costs.

Indexed as

Deep LearningDiagnosis, Computer-AssistedMammographyNeural Networks, ComputerReproducibility of Results

Identifiers

PMID35869131
PMCPMC9307836

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.