ArticleAnalytical chemistry2022
Magnetic Sector Secondary Ion Mass Spectrometry on FIB-SEM Instruments for Nanoscale Chemical Imaging.
Article in Analytical chemistry, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 9 papers.
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Who cites it
9 citing papers in PubMed.
- Learning from Metal Nanocrystal Heterogeneity: A Need for Information-Rich and High-Throughput Single-Nanocrystal Measurements.ACS nanoscience Au · 2025Review
- Mass Spectrometry Imaging.Analytical chemistry · 2025Review
- Per- and polyfluoroalkyl substances (PFAS): immunotoxicity at the primary sites of exposure.Critical reviews in toxicology · 2025Review
- Focused ion beam-induced platinum deposition with a low-temperature cesium ion source.Beilstein journal of nanotechnology · 2025Article
- Lift-Out Specimen Preparation and Multiscale Correlative Investigation of Li-Ion Battery Electrodes Using Focused Ion Beam-Secondary Ion Mass Spectrometry Platforms.ACS applied materials & interfaces · 2024Article
- Secondary Ion Mass Spectral Imaging of Metals and Alloys.Materials (Basel, Switzerland) · 2024Review
- Spatial pharmacology using mass spectrometry imaging.Trends in pharmacological sciences · 2024Review
- TowardAnalytical chemistry · 2023Article
- Thermal Recovery of the Electrochemically Degraded LiCoOACS applied materials & interfaces · 2023Article
Corrections and comments
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Authors and funding
12 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
The structural, morphological, and chemical characterization of samples is of utmost importance for a large number of scientific fields. Furthermore, this characterization very often needs to be performed in three dimensions and at length scales down to the nanometer. Therefore, there is a stringent necessity to develop appropriate instrumentational solutions to fulfill these needs. Here we report on the deployment of magnetic sector secondary ion mass spectrometry (SIMS) on a type of instrument widely used for such nanoscale investigations, namely, focused ion beam (FIB)-scanning electron microscopy (SEM) instruments. First, we present the layout of the FIB-SEM-SIMS instrument and address its performance by using specific test samples. The achieved performance can be summarized as follows: an overall secondary ion beam transmission above 40%, a mass resolving power (
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Registered trials
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