Evidence map›Paper›PMID 35712776›Full record

ReviewAdvanced science (Weinheim, Baden-Wurttemberg, Germany)2022

Atomic Layer Deposition of Metal Oxides and Chalcogenides for High Performance Transistors.

Chengxu Shen, Zhigang Yin, Fionn Collins, Nicola Pinna

Abstract readReview
In one paragraph

Review in Advanced science (Weinheim, Baden-Wurttemberg, Germany), 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 15 papers.

0numbers the graph read from it
0cells of the map it votes in
15citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

15 citing papers in PubMed.

  1. Self-Powered Broadband High-Responsivity Photodetectors: p-(CuS)Small (Weinheim an der Bergstrasse, Germany) · 2026
    Article
  2. Article
  3. Article
  4. Pt/AlSmall methods · 2025
    Article
  5. Article
  6. Article
  7. Article
  8. Article
  9. Article
  10. Review
  11. Influence of NFMaterials (Basel, Switzerland) · 2023
    Article
  12. An Amorphous Native Oxide Shell for High Bias-Stress Stability Nanowire Synaptic Transistor.Advanced science (Weinheim, Baden-Wurttemberg, Germany) · 2023
    Article
  13. Interfacial Properties of the SnO/κ-GaACS applied materials & interfaces · 2023
    Article
  14. Article
  15. Atomic Layer Deposition of Metal Oxides and Chalcogenides for High Performance Transistors.Advanced science (Weinheim, Baden-Wurttemberg, Germany) · 2022
    Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Chengxu ShenInstitut für Chemie and IRIS Adlershof, Humboldt-Universität zu Berlin, Brook-Taylor-Str. 2, Berlin, 12489, Germany.
Zhigang YinInstitut für Chemie and IRIS Adlershof, Humboldt-Universität zu Berlin, Brook-Taylor-Str. 2, Berlin, 12489, Germany.ORCID https://orcid.org/0000-0002-1645-9524
Fionn CollinsInstitut für Chemie and IRIS Adlershof, Humboldt-Universität zu Berlin, Brook-Taylor-Str. 2, Berlin, 12489, Germany.
Nicola PinnaInstitut für Chemie and IRIS Adlershof, Humboldt-Universität zu Berlin, Brook-Taylor-Str. 2, Berlin, 12489, Germany.ORCID https://orcid.org/0000-0003-1273-803X

Funding

China Scholarship Council (CSC)Deutsche Forschungsgemeinschaft (DFG)Deutscher Akademischer Austauschdienst (DAAD)Director's Fund of Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China 2021ZR116National Natural Science Foundation of China 52173241Natural Science Foundation of Fujian Province for Distinguished Young Scholars 2019J06023
6 · The paper itself

Abstract

Atomic layer deposition (ALD) is a deposition technique well-suited to produce high-quality thin film materials at the nanoscale for applications in transistors. This review comprehensively describes the latest developments in ALD of metal oxides (MOs) and chalcogenides with tunable bandgaps, compositions, and nanostructures for the fabrication of high-performance field-effect transistors. By ALD various n-type and p-type MOs, including binary and multinary semiconductors, can be deposited and applied as channel materials, transparent electrodes, or electrode interlayers for improving charge-transport and switching properties of transistors. On the other hand, MO insulators by ALD are applied as dielectrics or protecting/encapsulating layers for enhancing device performance and stability. Metal chalcogenide semiconductors and their heterostructures made by ALD have shown great promise as novel building blocks to fabricate single channel or heterojunction materials in transistors. By correlating the device performance to the structural and chemical properties of the ALD materials, clear structure-property relations can be proposed, which can help to design better-performing transistors. Finally, a brief concluding remark on these ALD materials and devices is presented, with insights into upcoming opportunities and challenges for future electronics and integrated applications.

Indexed as

atomic layer depositionelectronicsmetal chalcogenidesmetal oxidestransistors

Identifiers

PMID35712776
PMCPMC9376853

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.