ArticleSensors (Basel, Switzerland)2022
Fast Fault Diagnosis in Industrial Embedded Systems Based on Compressed Sensing and Deep Kernel Extreme Learning Machines.
Article in Sensors (Basel, Switzerland), 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.
What it found
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
The trial behind it
Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.
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Who cites it
3 citing papers in PubMed.
- Benchmarking Modern Deep Learning Models for Electroluminescence-Based Solar Cell Defect Detection.Sensors (Basel, Switzerland) · 2026Article
- Early sepsis mortality prediction model based on interpretable machine learning approach: development and validation study.Internal and emergency medicine · 2025Article
- Deep Learning Techniques in Intelligent Fault Diagnosis and Prognosis for Industrial Systems: A Review.Sensors (Basel, Switzerland) · 2023Review
Corrections and comments
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Authors and funding
4 authors.
Funding
Abstract
With the complexity and refinement of industrial systems, fast fault diagnosis is crucial to ensuring the stable operation of industrial equipment. The main limitation of the current fault diagnosis methods is the lack of real-time performance in resource-constrained industrial embedded systems. Rapid online detection can help deal with equipment failures in time to prevent equipment damage. Inspired by the ideas of compressed sensing (CS) and deep extreme learning machines (DELM), a data-driven general method is proposed for fast fault diagnosis. The method contains two modules: data sampling and fast fault diagnosis. The data sampling module non-linearly projects the intensive raw monitoring data into low-dimensional sampling space, which effectively reduces the pressure of transmission, storage and calculation. The fast fault diagnosis module introduces the kernel function into DELM to accommodate sparse signals and then digs into the inner connection between the compressed sampled signal and the fault types to achieve fast fault diagnosis. This work takes full advantage of the sparsity of the signal to enable fast fault diagnosis online. It is a general method in industrial embedded systems under data-driven conditions. The results on the CWRU dataset and real platforms show that our method not only has a significant speed advantage but also maintains a high accuracy, which verifies the practical application value in industrial embedded systems.
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Registered trials
Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.