Evidence map›Paper›PMID 35562933›Full record

ArticleInternational journal of molecular sciences2022

Influence of Cr Ion Implantation on Physical Properties of CuO Thin Films.

Katarzyna Ungeheuer, Konstanty Waldemar Marszalek, Marzena Mitura-Nowak, Marcin Perzanowski, Piotr Jelen, Marta Marszalek, Maciej Sitarz

Abstract read
In one paragraph

Article in International journal of molecular sciences, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed.

  1. Article
  2. Article
  3. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

7 authors.

Katarzyna UngeheuerFaculty of Computer Science, Electronics and Telecommunications, AGH University of Science and Technology, 30-059 Krakow, Poland.
Konstanty Waldemar MarszalekFaculty of Computer Science, Electronics and Telecommunications, AGH University of Science and Technology, 30-059 Krakow, Poland.ORCID 0000-0002-0564-5743
Marzena Mitura-NowakThe Henryk Niewodniczanski Institute of Nuclear Physics Polish Academy of Sciences, 31-342 Krakow, Poland.ORCID 0000-0001-5124-8688
Marcin PerzanowskiThe Henryk Niewodniczanski Institute of Nuclear Physics Polish Academy of Sciences, 31-342 Krakow, Poland.ORCID 0000-0002-3319-3801
Piotr JelenFaculty of Material Science and Ceramics, AGH University of Science and Technology, 30-059 Krakow, Poland.ORCID 0000-0003-2905-6078
Marta MarszalekThe Henryk Niewodniczanski Institute of Nuclear Physics Polish Academy of Sciences, 31-342 Krakow, Poland.ORCID 0000-0002-6135-940X
Maciej SitarzFaculty of Material Science and Ceramics, AGH University of Science and Technology, 30-059 Krakow, Poland.ORCID 0000-0002-8339-2710

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Cupric oxide is a semiconductor with applications in sensors, solar cells, and solar thermal absorbers. To improve its properties, the oxide was doped with a metallic element. No studies were previously performed on Cr-doping using the ion implantation technique. The research goal of these studies is to investigate how Cr ion implantation impacts the properties of the oxide thin films. CuO thin films were deposited using magnetron sputtering, and then chromium ions with different energies and doses were implanted. Structural, optical, and vibrational properties of the samples were studied using X-ray diffraction, X-ray reflectivity, infra-red spectroscopy, Raman spectroscopy, and spectrophotometry. The surface morphology and topography were studied with ellipsometry, atomic force microscopy, and scanning electron microscopy. A simulation of the range of ions in the materials was performed. Ion implantation had an impact on the properties of thin films that could be used to tailor the optical properties of the cupric oxide and possibly also its electrical properties. A study considering the influence of ion implantation on electrical properties is proposed as further research on ion-implanted CuO thin films.

Indexed as

CopperOxidesIonsX-Ray DiffractionCoppercupric oxideIonsOxidescupric oxideion implantationsolar cell absorberthin film

Identifiers

PMID35562933
PMCPMC9101488

What OpenQuestion holds

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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.