ArticleRSC advances2018
Atomic-scale investigation of MgO growth on fused quartz using angle-dependent NEXAFS measurements.
Article in RSC advances, 2018. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 6 papers.
What it found
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
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Who cites it
6 citing papers in PubMed.
- Deposition of Sol-Gel ZnO:Mg Films and Investigation of Their Structural and Optical Properties.Materials (Basel, Switzerland) · 2022Article
- Synchrotron radiation based X-ray techniques for analysis of cathodes in Li rechargeable batteries.RSC advances · 2022Review
- Review
- Soft X-ray Absorption Spectroscopic Investigation of Li(NiNanomaterials (Basel, Switzerland) · 2020Article
- Article
- Microstructure, local electronic structure and optical behaviour of zinc ferrite thin films on glass substrate.Royal Society open science · 2018Article
Corrections and comments
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Authors and funding
5 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
The phenomena related to thin film growth have always been interesting to the scientific community. Experiments related to these phenomena not only provide an understanding but also suggest a path for the controlled growth of these films. For the present work, MgO thin film growth on fused quartz was investigated using angle-dependent near-edge X-ray absorption fine structure (NEXAFS) measurements. To understand the growth of MgO, sputtering was allowed for 5, 10, 25, 36, 49, 81, 144, 256, and 400 min in a vacuum better than 5.0 × 10
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Registered trials
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