Evidence map›Paper›PMID 35502717›Full record

ArticleActa crystallographica. Section A, Foundations and advances2022

Correlation between two- and three-dimensional crystallographic lattices for epitaxial analysis. I. Theory.

Josef Simbrunner, Jari Domke, Roman Forker, Roland Resel, Torsten Fritz

Abstract read
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Article in Acta crystallographica. Section A, Foundations and advances, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

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1citing papers in PubMed
–field-weighted citation impact
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3 · Its place in the literature

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1 citing paper in PubMed.

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4 · The record

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5 · Who and what money

Authors and funding

5 authors.

Josef SimbrunnerDivision of Neuroradiology, Vascular and Interventional Radiology, Medical University Graz, Auenbruggerplatz 9, Graz, 8036, Austria.ORCID 0000-0002-7207-9622
Jari DomkeInstitute of Solid State Physics, Friedrich Schiller University Jena, Helmholtzweg 5, Jena, 07743, Germany.ORCID 0000-0001-9339-0711
Roman ForkerInstitute of Solid State Physics, Friedrich Schiller University Jena, Helmholtzweg 5, Jena, 07743, Germany.ORCID 0000-0003-0969-9180
Roland ReselInstitute of Solid State Physics, Graz University of Technology, Petersgasse 16, Graz, 8010, Austria.ORCID 0000-0003-0079-3525
Torsten FritzInstitute of Solid State Physics, Friedrich Schiller University Jena, Helmholtzweg 5, Jena, 07743, Germany.ORCID 0000-0001-6904-1909

Funding

Austrian Science Fund P30222Austrian Science Fund FWF P 30222Bundesministerium für Bildung und Forschung 03VNE1052C
6 · The paper itself

Abstract

The epitaxial growth of molecular crystals at single-crystalline surfaces is often strongly related to the first monolayer at the substrate surface. The present work presents a theoretical approach to compare three-dimensional lattices of epitaxially grown crystals with two-dimensional lattices of the molecules formed within the first monolayer. Real-space and reciprocal-space representations are considered. Depending on the crystallographic orientation relative to the substrate surface, proper linear combinations of the lattice vectors of the three-dimensional unit cell result in a rhomboid in the xy plane, representing a two-dimensional projection. Mathematical expressions are derived which provide a relationship between the six lattice parameters of the three-dimensional case and the three parameters obtained for the two-dimensional surface unit cell. It is found that rotational symmetries of the monolayers are reflected by the epitaxial order. Positive and negative orientations of the crystallographic contact planes are correlated with the mirror symmetry of the surface unit cells, and the corresponding mathematical expressions are derived. The method is exemplarily applied to data obtained in previous grazing-incidence X-ray diffraction (GIXD) measurements with sample rotation on thin films of the conjugated molecules 3,4;9,10-perylenetetracarboxylic dianhydride (PTCDA), 6,13-pentacenequinone (P2O), 1,2;8,9-dibenzopentacene (trans-DBPen) and dicyanovinyl-quaterthiophene (DCV4T-Et2) grown by physical vapor deposition on Ag(111) and Cu(111) single crystals. This work introduces the possibility to study three-dimensional crystal growth nucleated by an ordered monolayer by combining two different experimental techniques, GIXD and low-energy electron diffraction, which has been implemented in the second part of this work.

Indexed as

crystallographic latticesGIXDmathematical crystallographysurface unit cellthin films

Identifiers

PMID35502717
PMCPMC9062828

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