Evidence map›Paper›PMID 35458035›Full record

ArticleNanomaterials (Basel, Switzerland)2022

Analysis of Low-Frequency 1/f Noise Characteristics for MoTe

Bing Zhang, Congzhen Hu, Youze Xin, Yaoxin Li, Yiyun Xie, Qian Xing, Zhuoqi Guo, Zhongming Xue, Dan Li, Guohe Zhang and 3 more

Abstract read
In one paragraph

Article in Nanomaterials (Basel, Switzerland), 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Article
  2. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

13 authors.

Bing ZhangSchool of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China.
Congzhen HuSchool of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China.
Youze XinSchool of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China.
Yaoxin LiSchool of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China.
Yiyun XieSchool of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China.
Qian XingSchool of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China.
Zhuoqi GuoSchool of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China.
Zhongming XueSchool of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China.
Dan LiSchool of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China.
Guohe ZhangSchool of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China.
Li GengSchool of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China.
Zungui KeDetector Laboratory of Southwest Institute of Technical Physics, Chengdu 610041, China.
Chi WangABAX Sensing Inc., Ningbo 315502, China.ORCID 0000-0001-6050-6730

Funding

National Natural Science Foundation of China 61874085, 62074126Postdoctoral Research Funding Project of Shaanxi Province 2018BSHEDZZ41Shaanxi Key Research and Development Plan 2020GY-019
6 · The paper itself

Abstract

Low-frequency electronic noise is an important parameter used for the electronic and sensing applications of transistors. Here, we performed a systematic study on the low-frequency noise mechanism for both p-channel and n-channel MoTe

Indexed as

carrier number fluctuationscontact resistancelow-frequency noiseMoTe2

Identifiers

PMID35458035
PMCPMC9030018

What OpenQuestion holds

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LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.