Evidence map›Paper›PMID 35407726›Full record

ArticleMaterials (Basel, Switzerland)2022

Characterization of Low-Loss Dielectric Materials for High-Speed and High-Frequency Applications.

Tzu-Nien Lee, John-H Lau, Cheng-Ta Ko, Tim Xia, Eagle Lin, Kai-Ming Yang, Puru-Bruce Lin, Chia-Yu Peng, Leo Chang, Jia-Shiang Chen and 5 more

Abstract read
In one paragraph

Article in Materials (Basel, Switzerland), 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 2 papers.

0numbers the graph read from it
0cells of the map it votes in
2citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

2 citing papers in PubMed.

  1. Article
  2. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

15 authors.

Tzu-Nien LeeUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
John-H LauUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Cheng-Ta KoUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Tim XiaUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Eagle LinUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Kai-Ming YangUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Puru-Bruce LinUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Chia-Yu PengUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Leo ChangUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Jia-Shiang ChenUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Yi-Hsiu FangUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Li-Yueh LiaoUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Edward CharnUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Jason WangUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.
Tzyy-Jang TsengUnimicron Technology Corporation, No. 179, Shanying Road, Taoyuan City 33341, Taiwan.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

In this study, the Df (dissipation factor or loss tangent) and Dk (dielectric constant or permittivity) of the low-loss dielectric material from three different vendors are measured by the Fabry-Perot open resonator (FPOR) technique. Emphasis is placed on the sample preparation, data collection, and the comparison with the data sheet values provided from vendors. A coplanar waveguide with ground (CPWG) test vehicle with one of these raw dielectric materials (vendor 1) is designed (through Polar and simulation) and fabricated. The impedance of the test vehicle is measured by TDR (time-domain reflectometer), and the effective Dk of the test vehicle is calculated by the real cross-section of the metal line width, spacing, and thickness of the test vehicle and a closed-form equation. In parallel, the insertion loss and return loss are measured with the VNA (vector network analyzer) of the test vehicle. Finally, the measurement and simulation results are correlated. Some recommendations on the low-loss dielectric materials of the Dk and Df are also provided.

Indexed as

dielectric materialshigh-speed and high-frequencyinsertion loss and return loss

Identifiers

PMID35407726
PMCPMC9000071

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.