Evidence map›Paper›PMID 35234454›Full record

ArticleACS applied materials & interfaces2022

Highly Reliable Flexible Device with a Charge Compensation Layer.

Hyojung Kim, Jongwoo Park, Taeyoung Khim, Jungmin Park, Chanhee Han, Jongmin Yoo, Dongbhin Kim, Jangkun Song, Byoungdeog Choi

Open access · greenAbstract read
In one paragraph

Article in ACS applied materials & interfaces, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 1 paper.

0numbers the graph read from it
0cells of the map it votes in
1citing papers in PubMed
0.9field-weighted citation impact, top 31% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

1 citing paper in PubMed, 11 citations in OpenAlex.

  1. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

9 authors at 2 institutions in 1 country.

Hyojung KimTechnology Reliability Team, OLED Business, Samsung Display Company, Limited, 181 Samsung-ro, Tangjeong-myeon, Asan-si 31454, Republic of Korea.ORCID https://orcid.org/0000-0002-2995-8058
Jongwoo ParkTechnology Reliability Team, OLED Business, Samsung Display Company, Limited, 181 Samsung-ro, Tangjeong-myeon, Asan-si 31454, Republic of Korea.
Taeyoung KhimTechnology Reliability Team, OLED Business, Samsung Display Company, Limited, 181 Samsung-ro, Tangjeong-myeon, Asan-si 31454, Republic of Korea.
Jungmin ParkDepartment of Semiconductor and Display Engineering, Sungkyunkwan University, Cheoncheon-dong 300, Jangan-gu, Suwon-si 16419, Republic of Korea.
Chanhee HanDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Cheoncheon-dong 300, Jangan-gu, Suwon-si 16419, Republic of Korea.
Jongmin YooDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Cheoncheon-dong 300, Jangan-gu, Suwon-si 16419, Republic of Korea.
Dongbhin KimDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Cheoncheon-dong 300, Jangan-gu, Suwon-si 16419, Republic of Korea.
Jangkun SongDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Cheoncheon-dong 300, Jangan-gu, Suwon-si 16419, Republic of Korea.ORCID https://orcid.org/0000-0003-1666-8438
Byoungdeog ChoiDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Cheoncheon-dong 300, Jangan-gu, Suwon-si 16419, Republic of Korea.ORCID https://orcid.org/0000-0003-0411-4323
Sungkyunkwan University · KRSamsung (South Korea) · KR

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Flexible devices fabricated with a polyimide (PI) substrate are essential for foldable, rollable, and stretchable products and various applications. However, inherent technical challenges remain in mobile charge-induced device instabilities and image retention, significantly hindering future technologies. Here, we introduce a new barrier material, SiCOH, into the backplane of amorphous indium gallium zinc oxide (a-IGZO) thin-film transistors (TFTs) and applied it to production-level flexible panels. We found that the SiCOH layer effectively compensates for the surface charging induced by fluorine ions at the interface between the PI substrate and the barrier layer under bias stress, thereby preventing abnormal positive shifts in threshold voltage (

Indexed as

a-IGZO devicedevice characterizationflexible electronic deviceimage stickingKelvin probe force microscopypolyimide substrateSiCOHSIMS

Identifiers

PMID35234454
PMCPMC8932315
OpenAlexW4214927956

What OpenQuestion holds

Textmetadata
LicenceCC BY-NC-ND
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.