Evidence map›Paper›PMID 35207987›Full record

ArticleMaterials (Basel, Switzerland)2022

Low Cost Embedded Copper Mesh Based on Cracked Template for Highly Durability Transparent EMI Shielding Films.

Anton S Voronin, Yurii V Fadeev, Mstislav O Makeev, Pavel A Mikhalev, Alexey S Osipkov, Alexander S Provatorov, Dmitriy S Ryzhenko, Gleb Y Yurkov, Mikhail M Simunin, Darina V Karpova and 7 more

Open access · goldAbstract read
In one paragraph

Article in Materials (Basel, Switzerland), 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 7 papers.

0numbers the graph read from it
0cells of the map it votes in
7citing papers in PubMed
1.5field-weighted citation impact, top 19% of its field
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

7 citing papers in PubMed, 26 citations in OpenAlex.

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4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

17 authors at 5 institutions in 1 country.

Anton S VoroninDepartment of Molecular Electronics, Federal Research Center «Krasnoyarsk Scientific Center», Siberian Branch, Russian Academy of Sciences (FRC KSC SB RAS), 660036 Krasnoyarsk, Russia.ORCID 0000-0001-6908-9945
Yurii V FadeevDepartment of Molecular Electronics, Federal Research Center «Krasnoyarsk Scientific Center», Siberian Branch, Russian Academy of Sciences (FRC KSC SB RAS), 660036 Krasnoyarsk, Russia.
Mstislav O MakeevLaboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia.ORCID 0000-0001-8945-3919
Pavel A MikhalevLaboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia.ORCID 0000-0003-0672-4627
Alexey S OsipkovLaboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia.ORCID 0000-0003-3603-2621
Alexander S ProvatorovLaboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia.
Dmitriy S RyzhenkoLaboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia.
Gleb Y YurkovLaboratory of EMI Shielding Materials, Bauman Moscow State Technical University, 105005 Moscow, Russia.ORCID 0000-0001-9814-9724
Mikhail M SimuninDepartment of Molecular Electronics, Federal Research Center «Krasnoyarsk Scientific Center», Siberian Branch, Russian Academy of Sciences (FRC KSC SB RAS), 660036 Krasnoyarsk, Russia.ORCID 0000-0001-9317-1113
Darina V KarpovaDepartment of Molecular Electronics, Federal Research Center «Krasnoyarsk Scientific Center», Siberian Branch, Russian Academy of Sciences (FRC KSC SB RAS), 660036 Krasnoyarsk, Russia.
Anna V LukyanenkoSchool of Engineering Physics and Radio Electronics, Siberian Federal University, 660041 Krasnoyarsk, Russia.
Dieter KokhDepartment of Molecular Electronics, Federal Research Center «Krasnoyarsk Scientific Center», Siberian Branch, Russian Academy of Sciences (FRC KSC SB RAS), 660036 Krasnoyarsk, Russia.
Dashi D BainovLaboratory for Radiation and Plasma Technologies, Tomsk Polytechnic University, 634050 Tomsk, Russia.
Igor A TambasovLaboratory of Photonics of Molecular Systems, L.V. Kirensky Institute of Physics, Siberian Branch, Russian Academy of Sciences, 660036 Krasnoyarsk, Russia.
Sergey V NedelinSchool of Engineering Physics and Radio Electronics, Siberian Federal University, 660041 Krasnoyarsk, Russia.
Nikita A ZolotovskySchool of Engineering Physics and Radio Electronics, Siberian Federal University, 660041 Krasnoyarsk, Russia.
Stanislav V KhartovDepartment of Molecular Electronics, Federal Research Center «Krasnoyarsk Scientific Center», Siberian Branch, Russian Academy of Sciences (FRC KSC SB RAS), 660036 Krasnoyarsk, Russia.
Bauman Moscow State Technical University · RUKrasnoyarsk Scientific Center · RUInstitute of Physics · RUOptolink (Russia) · RUNational Research Tomsk State University · RU

Funding

Ministry of Science and Higher Education of the Russian Federation State task №. 0287-2021-0026Ministry of Science and Higher Education of the Russian Federation State task №. 0705-2020-0032.
6 · The paper itself

Abstract

Embedded copper mesh coatings with low sheet resistance and high transparency were formed using a low-cost Cu seed mesh obtained with a magnetron sputtering on a cracked template, and subsequent operations electroplating and embedding in a photocurable resin layer. The influence of the mesh size on the optoelectric characteristics and the electromagnetic shielding efficiency in a wide frequency range is considered. In optimizing the coating properties, a shielding efficiency of 49.38 dB at a frequency of 1 GHz, with integral optical transparency in the visible range of 84.3%, was obtained. Embedded Cu meshes have been shown to be highly bending stable and have excellent adhesion strength. The combination of properties and economic costs for the formation of coatings indicates their high prospects for practical use in shielding transparent objects, such as windows and computer monitors.

Indexed as

cracked templatedurabilityelectroplatingembedded meshphotocurable resintransparent electromagnetic interference (EMI) shielding films

Identifiers

PMID35207987
PMCPMC8879047
OpenAlexW4213275098

What OpenQuestion holds

Textmetadata
LicenceCC BY
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.