ArticleSensors (Basel, Switzerland)2022
A CMOS Image Sensor Based Refractometer without Spectrometry.
Article in Sensors (Basel, Switzerland), 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Not yet cited in PubMed.
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
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Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.
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0 citing papers in PubMed, 5 citations in OpenAlex.
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Authors and funding
7 authors at 2 institutions in 1 country.
Funding
Abstract
The refractive index (RI), an important optical property of a material, is measured by commercial refractometers in the food, agricultural, chemical, and manufacturing industries. Most of these refractometers must be equipped with a prism for light dispersion, which drastically limits the design and size of the refractometer. Recently, there have been several reports on the development of a surface plasmon resonance (SPR)-based RI detector, which is characterized by its high sensitivity and simplicity. However, regardless of the prism, an expensive spectrometer is required to analyze the resonance wavelength or angle of incidence. This paper proposes a method that eliminates the need for the prism and other conventional spectrometer components. For this purpose, total internal reflection SPR technology was used on an Ag thin film, and RI analysis was combined with a lens-free CMOS image sensor or a smartphone camera. A finite-difference time-domain (FDTD) numerical simulation was performed to evaluate the relationship between the output power intensity and Ag film thickness for different RIs at three wavelengths of commercial light-emitting diodes (LEDs). The maximum sensitivity of -824.54 RIU
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Registered trials
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