ArticleScientific reports2022
Effect of thickness and reaction media on properties of ZnO thin films by SILAR.
Article in Scientific reports, 2022. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 9 papers.
What it found
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Who cites it
9 citing papers in PubMed, 109 citations in OpenAlex.
- Functional Inversion of Trisodium Citrate from a [0001] Growth Suppressor to a Promoter in ZnO Thin Film Fabrication.ACS omega · 2026Article
- Wafer-Level Self-Assembly and Interface Passivation Patterning Technology for Nanomaterial-Compatible 3D MEMS Sensing Chips.Nano-micro letters · 2026Article
- Thickness Influences on Structural and Optical Properties of Thermally Annealed (GaIn)Nanomaterials (Basel, Switzerland) · 2025Article
- Article
- Aluminum doped zinc oxide nanoplatelets based sensor with enhanced hydrogen sulfide detection.Scientific reports · 2025Article
- Synthesis and performance evaluation of ZnO/CdS photoanodes with copper sulfide (CuScientific reports · 2024Article
- Effects of Hydrogen Plasma Treatment on the Electrical Behavior of Solution-Processed ZnO Thin Films.Materials (Basel, Switzerland) · 2024Article
- Article
- Various Applications of ZnO Thin Films Obtained by Chemical Routes in the Last Decade.Molecules (Basel, Switzerland) · 2023Review
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Authors and funding
5 authors at 1 institution in 1 country.
Funding
No grant is acknowledged in the PubMed record.
Abstract
Zinc oxide (ZnO) is one of the most promising metal oxide semiconductor materials, particularly for optical and gas sensing applications. The influence of thickness and solvent on various features of ZnO thin films deposited at ambient temperature and barometric pressure by the sequential ionic layer adsorption and reaction method (SILAR) was carefully studied in this work. Ethanol and distilled water (DW) were alternatively used as a solvent for preparation of ZnO precursor solution. Superficial morphology, crystallite structure, optical and electrical characteristics of the thin films of various thickness are examined applying X-ray diffraction (XRD) system, scanning electron microscopy, the atomic force microscopy, X-ray photoelectron spectroscopy, ultraviolet-visible spectroscopy, photoluminescence spectroscopy, Hall effect measurement analysis and UV response study. XRD analysis confirmed that thin films fabricated using ethanol or DW precursor solvents are hexagonal wurtzite ZnO with a preferred growth orientation (002). Furthermore, it was found that thin films made using ethanol are as highly crystalline as thin films made using DW. ZnO thin films prepared using aqueous solutions possess high optical band gaps. However, films prepared with ethanol solvent have low resistivity (10
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Registered trials
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