Evidence map›Paper›PMID 34963916›Full record

ArticleACS omega2021

Aerosol Jet Printing of Graphene and Carbon Nanotube Patterns on Realistically Rugged Substrates.

Reinhard Kaindl, Tushar Gupta, Alexander Blümel, Songfeng Pei, Peng-Xiang Hou, Jinhong Du, Chang Liu, Paul Patter, Karl Popovic, David Dergez and 9 more

Abstract read
In one paragraph

Article in ACS omega, 2021. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 5 papers.

0numbers the graph read from it
0cells of the map it votes in
5citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

5 citing papers in PubMed.

  1. Article
  2. Review
  3. Article
  4. Article
  5. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

19 authors.

Reinhard KaindlMATERIALS-Institute for Surface Technologies and Photonics, JOANNEUM RESEARCH, Leobner Str. 94, A-8712 Niklasdorf, Austria.
Tushar GuptaInstitute of Materials Chemistry, Technische Universität Wien (TU Wien), Getreidemarkt 9/165, A-1060 Vienna, Austria.
Alexander BlümelMATERIALS-Institute for Surface Technologies and Photonics, JOANNEUM RESEARCH, Franz-Pichler-Str. 30, A-8160 Weiz, Austria.
Songfeng PeiShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 110016 Shenyang, P. R. China.
Peng-Xiang HouShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 110016 Shenyang, P. R. China.
Jinhong DuShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 110016 Shenyang, P. R. China.
Chang LiuShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 110016 Shenyang, P. R. China.ORCID https://orcid.org/0000-0003-3016-3997
Paul PatterMATERIALS-Institute for Surface Technologies and Photonics, JOANNEUM RESEARCH, Franz-Pichler-Str. 30, A-8160 Weiz, Austria.
Karl PopovicMATERIALS-Institute for Surface Technologies and Photonics, JOANNEUM RESEARCH, Franz-Pichler-Str. 30, A-8160 Weiz, Austria.
David DergezZKW Elektronik GmbH, Samuel-Morse-Str. 18, A-2700 Wiener Neustadt, Austria.
Kenan ElibolFaculty of Physics, University of Vienna, Boltzmanngasse 5, A-1090 Vienna, Austria.ORCID https://orcid.org/0000-0002-8765-2794
Erhard SchaflerFaculty of Physics, University of Vienna, Boltzmanngasse 5, A-1090 Vienna, Austria.
Johan LiuDepartment of Microtechnology and Nanoscience, Electronics Materials and Systems Laboratory, Chalmers University of Technology, Kemivägen 9, Se 412 96 Gothenburg, Sweden.ORCID https://orcid.org/0000-0001-9931-1439
Dominik EderInstitute of Materials Chemistry, Technische Universität Wien (TU Wien), Getreidemarkt 9/165, A-1060 Vienna, Austria.ORCID https://orcid.org/0000-0002-5395-564X
Dietmar KieslingerZKW Elektronik GmbH, Samuel-Morse-Str. 18, A-2700 Wiener Neustadt, Austria.
Wencai RenShenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 110016 Shenyang, P. R. China.ORCID https://orcid.org/0000-0003-4997-8870
Paul HartmannMATERIALS-Institute for Surface Technologies and Photonics, JOANNEUM RESEARCH, Leobner Str. 94, A-8712 Niklasdorf, Austria.
Wolfgang WaldhauserMATERIALS-Institute for Surface Technologies and Photonics, JOANNEUM RESEARCH, Leobner Str. 94, A-8712 Niklasdorf, Austria.
Bernhard C BayerInstitute of Materials Chemistry, Technische Universität Wien (TU Wien), Getreidemarkt 9/165, A-1060 Vienna, Austria.ORCID https://orcid.org/0000-0002-4829-3207

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Direct-write additive manufacturing of graphene and carbon nanotube (CNT) patterns by aerosol jet printing (AJP) is promising for the creation of thermal and electrical interconnects in (opto)electronics. In realistic application scenarios, this however often requires deposition of graphene and CNT patterns on rugged substrates such as, for example, roughly machined and surface-oxidized metal block heat sinks. Most AJP of graphene/CNT patterns has thus far however concentrated on flat wafer- or foil-type substrates. Here, we demonstrate AJP of graphene and single walled CNT (SWCNT) patterns on realistically rugged plasma-electrolytic-oxidized (PEO) Al blocks, which are promising heat sink materials. We show that AJP on the rugged substrates offers line resolution of down to ∼40 μm width for single AJP passes, however, at the cost of noncomplete substrate coverage including noncovered μm-sized pores in the PEO Al blocks. With multiple AJP passes, full coverage including coverage of the pores is, however, readily achieved. Comparing archetypical aqueous and organic graphene and SWCNT inks, we show that the choice of the ink system drastically influences the nanocarbon AJP parameter window, deposit microstructure including crystalline quality, compactness of deposit, and inter/intrapass layer adhesion for multiple passes. Simple electrical characterization indicates aqueous graphene inks as the most promising choice for AJP-deposited electrical interconnect applications. Our parameter space screening thereby forms a framework for rational process development for graphene and SWCNT AJP on application-relevant, rugged substrates.

Identifiers

PMID34963916
PMCPMC8697012

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.