Evidence map›Paper›PMID 34750451›Full record

ArticleScientific reports2021

Effects of polyimide curing on image sticking behaviors of flexible displays.

Hyojung Kim, Jongwoo Park, Sora Bak, Jungmin Park, Changwoo Byun, Changyong Oh, Bo Sung Kim, Chanhee Han, Jongmin Yoo, Dongbhin Kim and 3 more

Abstract read
PubMed Full text at PMC Publisher
In one paragraph

Article in Scientific reports, 2021. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed.

  1. Article
  2. Article
  3. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

13 authors.

Hyojung KimTechnology Reliability Team, OLED Business, Samsung Display Co., Ltd., Asan, South Korea.
Jongwoo ParkTechnology Reliability Team, OLED Business, Samsung Display Co., Ltd., Asan, South Korea.
Sora BakTechnology Reliability Team, OLED Business, Samsung Display Co., Ltd., Asan, South Korea.
Jungmin ParkDepartment of Semiconductor and Display Engineering, Sungkyunkwan University, Suwon, South Korea.
Changwoo ByunResearch Center for Materials, Components and Equipment, Advanced Institutes of Convergence Technology (AICT), Seoul National University, Suwon, South Korea.
Changyong OhDepartment of Applied Physics, Korea University, Sejong, South Korea.
Bo Sung KimDepartment of Applied Physics, Korea University, Sejong, South Korea.
Chanhee HanDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea.
Jongmin YooDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea.
Dongbhin KimDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea.
Jangkun SongDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea.
Pyungho ChoiDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea.
Byoungdeog ChoiDepartment of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea. bdchoi@skku.edu.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Flexible displays on a polyimide (PI) substrate are widely regarded as a promising next-generation display technology due to their versatility in various applications. Among other bendable materials used as display panel substrates, PI is especially suitable for flexible displays for its high glass transition temperature and low coefficient of thermal expansion. PI cured under various temperatures (260 °C, 360 °C, and 460 °C) was implemented in metal-insulator-metal (MIM) capacitors, amorphous indium gallium zinc oxide (a-IGZO) thin-film transistors (TFT), and actual display panels to analyze device stability and panel product characteristics. Through electrical analysis of the MIM capacitor, it was confirmed that the charging effect in the PI substrates intensified as the PI curing temperature increased. The threshold voltage shift (ΔV

Identifiers

PMID34750451
PMCPMC8575959

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.