Evidence map›Paper›PMID 34685147›Full record

ArticleNanomaterials (Basel, Switzerland)2021

Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images.

Haotian Wen, José María Luna-Romera, José C Riquelme, Christian Dwyer, Shery L Y Chang

Abstract read
In one paragraph

Article in Nanomaterials (Basel, Switzerland), 2021. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 8 papers.

0numbers the graph read from it
0cells of the map it votes in
8citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

8 citing papers in PubMed.

  1. Article
  2. Review
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4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

5 authors.

Haotian WenSchool of Materials Science and Engineering, University of New South Wales, Sydney, NSW 2052, Australia.ORCID 0000-0003-1870-8077
José María Luna-RomeraSoftware and Computing Systems, Universidad de Sevilla, 41004 Seville, Spain.ORCID 0000-0002-3397-4704
José C RiquelmeSoftware and Computing Systems, Universidad de Sevilla, 41004 Seville, Spain.ORCID 0000-0002-8243-2186
Christian DwyerElectron Imaging and Spectroscopy Tools, Sydney, NSW 2219, Australia.
Shery L Y ChangSchool of Materials Science and Engineering, University of New South Wales, Sydney, NSW 2052, Australia.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

The morphology of nanoparticles governs their properties for a range of important applications. Thus, the ability to statistically correlate this key particle performance parameter is paramount in achieving accurate control of nanoparticle properties. Among several effective techniques for morphological characterization of nanoparticles, transmission electron microscopy (TEM) can provide a direct, accurate characterization of the details of nanoparticle structures and morphology at atomic resolution. However, manually analyzing a large number of TEM images is laborious. In this work, we demonstrate an efficient, robust and highly automated unsupervised machine learning method for the metrology of nanoparticle systems based on TEM images. Our method not only can achieve statistically significant analysis, but it is also robust against variable image quality, imaging modalities, and particle dispersions. The ability to efficiently gain statistically significant particle metrology is critical in advancing precise particle synthesis and accurate property control.

Indexed as

image analysismachine learningnanoparticles

Identifiers

PMID34685147
PMCPMC8539342

What OpenQuestion holds

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LicenceCC BY
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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.