A single setup approach for the MRI-based measurement and validation of the transfer function of elongated medical implants.

purposeTo propose a single setup using the MRI to both measure and validate the transfer function (TF) of linear implants. Conventionally, the TF of an implant is measured in one bench setup and validated using another.

methodsIt has been shown that the TF can be measured using MRI. To validate this measurement, the implant is exposed to different incident electric fields, while the temperature increase at the tip is monitored. For a good validation, the incident electric fields that the implant is exposed to should be orthogonal. We perform a simulation study on six different methods that change the incident electric field. Afterward, a TF measurement and validation study using the best method from the simulations is performed. This is done with fiberoptic temperature probes at 1.5 T for four linear implant structures using the proposed single setup.

resultsThe simulation study showed that positioning local transmit coils at different locations along the lead trajectory has a similar validation quality compared with changing the implant trajectory (ie, the conventional validation method). For the validation study that was performed, an R

conclusionA single setup to both measure and validate the transfer function using local transmit coils has been shown to work. The benefits of using the proposed validation method are that there is only one setup required instead of two and the implant trajectory is not varied; therefore, the relative distance between the leap tip and the temperature probe is constant.