ArticleIUCrJ2021
General method to calculate the elastic deformation and X-ray diffraction properties of bent crystal wafers.
Article in IUCrJ, 2021. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.
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3 citing papers in PubMed.
- Laboratory-based X-ray spectrometer for actinide science.Journal of synchrotron radiation · 2023Article
- A von Hámos spectrometer for diamond anvil cell experiments at the High Energy Density Instrument of the European X-ray Free-Electron Laser.Journal of synchrotron radiation · 2023Article
- A compact von Hámos spectrometer for parallel X-ray Raman scattering and X-ray emission spectroscopy at ID20 of the European Synchrotron Radiation Facility.Journal of synchrotron radiation · 2023Article
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2 authors.
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Abstract
Toroidally and spherically bent single crystals are widely employed as optical elements in hard X-ray spectrometry at synchrotron and free-electron laser light sources, and in laboratory-scale instruments. To achieve optimal spectrometer performance, a solid theoretical understanding of the diffraction properties of such crystals is essential. In this work, a general method to calculate the internal stress and strain fields of toroidally bent crystals and how to apply it to predict their diffraction properties is presented. Solutions are derived and discussed for circular and rectangular spherically bent wafers due to their prevalence in contemporary instrumentation.
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