Evidence map›Paper›PMID 33437576›Full record

ReviewAdvanced science (Weinheim, Baden-Wurttemberg, Germany)2020

Approaches for Long Lifetime Organic Light Emitting Diodes.

Sujith Sudheendran Swayamprabha, Deepak Kumar Dubey, Shahnawaz, Rohit Ashok Kumar Yadav, Mangey Ram Nagar, Aayushi Sharma, Fu-Ching Tung, Jwo-Huei Jou

Abstract readReview
In one paragraph

Review in Advanced science (Weinheim, Baden-Wurttemberg, Germany), 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 51 papers.

0numbers the graph read from it
0cells of the map it votes in
51citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

51 citing papers in PubMed.

  1. Article
  2. Review
  3. Review
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  5. Article
  6. Article
  7. Challenges of II-VI and III-V Blue Quantum Dot Light-Emitting Diodes.Advanced materials (Deerfield Beach, Fla.) · 2026
    Review
  8. Article
  9. Review
  10. Article
  11. Article
  12. Article
  13. Article
  14. Article
  15. Article
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  17. Article
  18. Article
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4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

8 authors.

Sujith Sudheendran SwayamprabhaDepartment of Materials Science and Engineering National Tsing Hua University Hsinchu 30013 Taiwan, Republic of China.
Deepak Kumar DubeyDepartment of Materials Science and Engineering National Tsing Hua University Hsinchu 30013 Taiwan, Republic of China.
ShahnawazDepartment of Materials Science and Engineering National Tsing Hua University Hsinchu 30013 Taiwan, Republic of China.
Rohit Ashok Kumar YadavDepartment of Materials Science and Engineering National Tsing Hua University Hsinchu 30013 Taiwan, Republic of China.
Mangey Ram NagarDepartment of Materials Science and Engineering National Tsing Hua University Hsinchu 30013 Taiwan, Republic of China.
Aayushi SharmaBirla Institute of Technology & Science-Pilani Shamirpet-Keesara Road, Jawahar Nagar, Shameerpet Hyderabad Telangana 500078 India.
Fu-Ching TungDepartment of Solid State Lighting Technology Mechanical and Mechatronics Systems Research Labs. Industrial Technology and Research Institute Hsinchu 31057 Taiwan, Republic of China.
Jwo-Huei JouDepartment of Materials Science and Engineering National Tsing Hua University Hsinchu 30013 Taiwan, Republic of China.ORCID https://orcid.org/0000-0002-9413-0206

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Organic light emitting diodes (OLEDs) have been well known for their potential usage in the lighting and display industry. The device efficiency and lifetime have improved considerably in the last three decades. However, for commercial applications, operational lifetime still lies as one of the looming challenges. In this review paper, an in-depth description of the various factors which affect OLED lifetime, and the related solutions is attempted to be consolidated. Notably, all the known intrinsic and extrinsic degradation phenomena and failure mechanisms, which include the presence of dark spot, high heat during device operation, substrate fracture, downgrading luminance, moisture attack, oxidation, corrosion, electron induced migrations, photochemical degradation, electrochemical degradation, electric breakdown, thermomechanical failures, thermal breakdown/degradation, and presence of impurities within the materials and evaporator chamber are reviewed. Light is also shed on the materials and device structures which are developed in order to obtain along with developed materials and device structures to obtain stable devices. It is believed that the theme of this report, summarizing the knowledge of mechanisms allied with OLED degradation, would be contributory in developing better-quality OLED materials and, accordingly, longer lifespan devices.

Indexed as

degradationdevice architecturelifetimematerialsOLED

Identifiers

PMID33437576
PMCPMC7788592

What OpenQuestion holds

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Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.