ArticleSensors (Basel, Switzerland)2020
X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors.
Article in Sensors (Basel, Switzerland), 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 5 papers.
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Who cites it
5 citing papers in PubMed.
- High magnification optical imaging systems for the characterization of soft X-ray focii.Journal of synchrotron radiation · 2025Article
- Automated alignment of XFEL nanofocusing mirrors via wavefront optimization.Journal of synchrotron radiation · 2025Article
- Ultrathin monolithic bimorph mirror using polarization-inverted lithium niobate wafer.Scientific reports · 2025Article
- Special Issue "EUV and X-ray Wavefront Sensing".Sensors (Basel, Switzerland) · 2022Article
- Hard X-ray nanoprobe scanner.IUCrJ · 2021Article
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Authors and funding
7 authors.
Funding
Abstract
X-ray single-grating interferometry was applied to conduct accurate wavefront corrections for hard X-ray nanofocusing mirrors. Systematic errors in the interferometer, originating from a grating, a detector, and alignment errors of the components, were carefully examined. Based on the measured wavefront errors, the mirror shapes were directly corrected using a differential deposition technique. The corrected X-ray focusing mirrors with a numerical aperture of 0.01 attained two-dimensionally diffraction-limited performance. The results of the correction indicate that the uncertainty of the wavefront measurement was less than
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