Evidence map›Paper›PMID 33297533›Full record

ArticleMaterials (Basel, Switzerland)2020

A Multiscale Topographical Analysis Based on Morphological Information: The HEVC Multiscale Decomposition.

Tarek Eseholi, François-Xavier Coudoux, Patrick Corlay, Rahmad Sadli, Maxence Bigerelle

Abstract read
In one paragraph

Article in Materials (Basel, Switzerland), 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.

0numbers the graph read from it
0cells of the map it votes in
4citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

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3 · Its place in the literature

Who cites it

4 citing papers in PubMed.

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4 · The record

Corrections and comments

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5 · Who and what money

Authors and funding

5 authors.

Tarek EseholiOpto-Acousto-Electronics Department, Institute of Electronics, Microelectronics and Nanotechnology (IEMN), UMR-CNRS 8520, Polytechnic University of Hauts-de-France, Le Mont Houy, 59313 Valenciennes, France.ORCID 0000-0002-2111-9196
François-Xavier CoudouxOpto-Acousto-Electronics Department, Institute of Electronics, Microelectronics and Nanotechnology (IEMN), UMR-CNRS 8520, Polytechnic University of Hauts-de-France, Le Mont Houy, 59313 Valenciennes, France.ORCID 0000-0002-5817-7429
Patrick CorlayOpto-Acousto-Electronics Department, Institute of Electronics, Microelectronics and Nanotechnology (IEMN), UMR-CNRS 8520, Polytechnic University of Hauts-de-France, Le Mont Houy, 59313 Valenciennes, France.
Rahmad SadliOpto-Acousto-Electronics Department, Institute of Electronics, Microelectronics and Nanotechnology (IEMN), UMR-CNRS 8520, Polytechnic University of Hauts-de-France, Le Mont Houy, 59313 Valenciennes, France.
Maxence BigerelleLaboratory of Industrial and Human Automation Control, Mechanical Engineering and Computer Science, (LAMIH) UMR-CNRS 8201, Polytechnic University of Hauts-de-France, Le Mont Houy, 59313 Valenciennes, France.

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

In this paper, we evaluate the effect of scale analysis as well as the filtering process on the performances of an original compressed-domain classifier in the field of material surface topographies classification. Each surface profile is multiscale analyzed by using a Gaussian Filter analyzing method to be decomposed into three multiscale filtered image types: Low-pass (LP), Band-pass (BP), and High-pass (HP) filtered versions, respectively. The complete set of filtered image data constitutes the collected database. First, the images are lossless compressed using the state-of-the art High-efficiency video coding (HEVC) video coding standard. Then, the Intra-Prediction Modes Histogram (IPHM) feature descriptor is computed directly in the compressed domain from each HEVC compressed image. Finally, we apply the IPHM feature descriptors as an input of a Support Vector Machine (SVM) classifier. SVM is introduced here to strengthen the performances of the proposed classification system thanks to the powerful properties of machine learning tools. We evaluate the proposed solution we called "HEVC Multiscale Decomposition" (HEVC-MD) on a huge database of nearly 42,000 multiscale topographic images. A simple preliminary version of the algorithm reaches an accuracy of 52%. We increase this accuracy to 70% by using the multiscale analysis of the high-frequency range HP filtered image data sets. Finally, we verify that considering only the highest-scale analysis of low-frequency range LP was more appropriate for classifying our six surface topographies with an accuracy of up to 81%. To compare these new topographical descriptors to those conventionally used, SVM is applied on a set of 34 roughness parameters defined on the International Standard GPS ISO 25178 (Geometrical Product Specification), and one obtains accuracies of 38%, 52%, 65%, and 57% respectively for Sa, multiscale Sa, 34 roughness parameters, and multiscale ones. Compared to conventional roughness descriptors, the HEVC-MD descriptors increase surfaces discrimination from 65% to 81%.

Indexed as

high-efficiency video coding (HEVC)mechanical engineeringroughness analysissupport vector machine (SVM)surface roughnesstexture feature descriptorstexture image classification

Identifiers

PMID33297533
PMCPMC7729792

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.