ArticleACS photonics2020
Super-Resolution without Imaging: Library-Based Approaches Using Near-to-Far-Field Transduction by a Nanophotonic Structure.
Article in ACS photonics, 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.
What it found
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The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.
The trial behind it
Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.
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Who cites it
3 citing papers in PubMed.
- Non-perturbative cathodoluminescence microscopy of beam-sensitive materials.Nanophotonics (Berlin, Germany) · 2025Article
- Nanometer Interlaced Displacement Metrology Using Diffractive Pancharatnam-Berry and Detour Phase Metasurfaces.ACS photonics · 2024Article
- Super-resolution imaging: when biophysics meets nanophotonics.Nanophotonics (Berlin, Germany) · 2022Review
Corrections and comments
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Authors and funding
6 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
Super-resolution imaging is often viewed in terms of engineering narrow point spread functions, but nanoscale optical metrology can be performed without real-space imaging altogether. In this paper, we investigate how partial knowledge of scattering nanostructures enables extraction of nanoscale spatial information from far-field radiation patterns. We use principal component analysis to find patterns in calibration data and use these patterns to retrieve the position of a point source of light. In an experimental realization using angle-resolved cathodoluminescence, we retrieve the light source position with an average error below λ/100. The patterns found by principal component analysis reflect the underlying scattering physics and reveal the role the scattering nanostructure plays in localization success. The technique described here is highly general and can be applied to gain insight into and perform subdiffractive parameter retrieval in various applications.
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Registered trials
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