ArticleScientific reports2020
Anomalous electrical conduction and negative temperature coefficient of resistance in nanostructured gold resistive switching films.
Article in Scientific reports, 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 5 papers.
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Who cites it
5 citing papers in PubMed.
- Modeling and validation of anisotropic thin-film deposition on cylindrical substrates for predictable resistance control in MEMS fabrication.Discover mechanical engineering · 2026Article
- Modeling and Validation of Anisotropic Thin-Film Deposition on Cylindrical Substrates for Predictable Resistance Control in MEMS Fabrication.Research square · 2025Article
- Inkjet printed IGZO memristors with volatile and non-volatile switching.Scientific reports · 2024Article
- Engineering the structural and electrical interplay of nanostructured Au resistive switching networks by controlling the forming process.Scientific reports · 2023Article
- Dynamical stochastic simulation of complex electrical behavior in neuromorphic networks of metallic nanojunctions.Scientific reports · 2022Article
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Authors and funding
6 authors.
Funding
No grant is acknowledged in the PubMed record.
Abstract
We report the observation of non-metallic electrical conduction, resistive switching, and a negative temperature coefficient of resistance in nanostructured gold films above the electrical percolation and in strong-coupling regime, from room down to cryogenic temperatures (24 K). Nanostructured continuous gold films are assembled by supersonic cluster beam deposition of Au aggregates formed in the gas phase. The structure of the cluster-assembled films is characterized by an extremely high density of randomly oriented crystalline nanodomains, separated by grain boundaries and with a large number of lattice defects. Our data indicates that space charge limited conduction and Coulomb blockade are at the origin of the anomalous electrical behavior. The high density of extended defects and grain boundaries causes the localization of conduction electrons over the entire investigated temperature range.
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Registered trials
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