Evidence map›Paper›PMID 33096294›Full record

ArticleUltramicroscopy2020

Orientation mapping of graphene using 4D STEM-in-SEM.

Benjamin W Caplins, Jason D Holm, Ryan M White, Robert R Keller

Abstract read
In one paragraph

Article in Ultramicroscopy, 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed.

  1. Article
  2. Article
  3. Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Benjamin W CaplinsNational Institute of Standards and Technology, Applied Chemicals and Materials Division, Boulder, CO, 80305, United States. Electronic address: benjamin.caplins@nist.gov.
Jason D HolmNational Institute of Standards and Technology, Applied Chemicals and Materials Division, Boulder, CO, 80305, United States.
Ryan M WhiteNational Institute of Standards and Technology, Applied Chemicals and Materials Division, Boulder, CO, 80305, United States.
Robert R KellerNational Institute of Standards and Technology, Applied Chemicals and Materials Division, Boulder, CO, 80305, United States.

Funding

Intramural NIST DOC 9999-NIST
6 · The paper itself

Abstract

A scanning diffraction technique is implemented in the scanning electron microscope. The technique, referred to as 4D STEM-in-SEM (four-dimensional scanning transmission electron microscopy in the scanning electron microscope), collects a diffraction pattern from each point on a sample which is saved to disk for further analysis. The diffraction patterns are collected using an on-axis lens-coupled phosphor/CCD arrangement. Synchronization between the electron beam and the camera exposure is accomplished with off-the-shelf data acquisition hardware. Graphene is used as a model system to test the sensitivity of the instrumentation and develop some basic analysis techniques. The data show interpretable diffraction patterns from monolayer graphene with integration times as short as 0.5 ms with a beam current of 245 pA (7.65×10

Indexed as

2D materials4D STEMGrapheneScanning electron microscopy (SEM)Scanning transmission electron microscopy (STEM)STEM-in-SEM

Identifiers

PMID33096294
PMCPMC8022335

What OpenQuestion holds

Textmetadata
LicenceTDM
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.