ArticleProceedings of the National Academy of Sciences of the United States of America2020
A symmetry-derived mechanism for atomic resolution imaging.
Article in Proceedings of the National Academy of Sciences of the United States of America, 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.
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4 citing papers in PubMed.
- Article
- Nonnegative matrix factorization incorporating domain specific constraints for four dimensional scanning transmission electron microscopy.Scientific reports · 2025Article
- Unsupervised machine learning combined with 4D scanning transmission electron microscopy for bimodal nanostructural analysis.Scientific reports · 2024Article
- Objective crystallographic symmetry classifications of a noisy crystal pattern with strong Fedorov-type pseudosymmetries and its optimal image-quality enhancement.Acta crystallographica. Section A, Foundations and advances · 2022Article
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2 authors.
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Abstract
We introduce an image-contrast mechanism for scanning transmission electron microscopy (STEM) that derives from the local symmetry within the specimen. For a given position of the electron probe on the specimen, the image intensity is determined by the degree of similarity between the exit electron-intensity distribution and a chosen symmetry operation applied to that distribution. The contrast mechanism detects both light and heavy atomic columns and is robust with respect to specimen thickness, electron-probe energy, and defocus. Atomic columns appear as sharp peaks that can be significantly narrower than for STEM images using conventional disk and annular detectors. This fundamentally different contrast mechanism complements conventional imaging modes and can be acquired simultaneously with them, expanding the power of STEM for materials characterization.
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