Evidence map›Paper›PMID 32995111›Full record

ReviewAdvanced science (Weinheim, Baden-Wurttemberg, Germany)2020

Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy.

Owoong Kwon, Daehee Seol, Huimin Qiao, Yunseok Kim

Abstract readReview
In one paragraph

Review in Advanced science (Weinheim, Baden-Wurttemberg, Germany), 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 12 papers.

0numbers the graph read from it
0cells of the map it votes in
12citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

12 citing papers in PubMed.

  1. Article
  2. Review
  3. Article
  4. Article
  5. Ferroelectric Field-Effect-Transistor Integrated with Ferroelectrics Heterostructure.Advanced science (Weinheim, Baden-Wurttemberg, Germany) · 2022
    Article
  6. Article
  7. Article
  8. Review
  9. Article
  10. Article
  11. Article
  12. Review
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

4 authors.

Owoong KwonSchool of Advanced Materials and Engineering & Research Center for Advanced Materials Technology Sungkyunkwan University (SKKU) Suwon 16419 Republic of Korea.
Daehee SeolSchool of Advanced Materials and Engineering & Research Center for Advanced Materials Technology Sungkyunkwan University (SKKU) Suwon 16419 Republic of Korea.
Huimin QiaoSchool of Advanced Materials and Engineering & Research Center for Advanced Materials Technology Sungkyunkwan University (SKKU) Suwon 16419 Republic of Korea.
Yunseok KimSchool of Advanced Materials and Engineering & Research Center for Advanced Materials Technology Sungkyunkwan University (SKKU) Suwon 16419 Republic of Korea.ORCID https://orcid.org/0000-0003-1794-1248

Funding

No grant is acknowledged in the PubMed record.

6 · The paper itself

Abstract

Piezoelectric and ferroelectric materials have garnered significant interest owing to their excellent physical properties and multiple potential applications. Accordingly, the need for evaluating piezoelectric and ferroelectric properties has also increased. The piezoelectric and ferroelectric properties are evaluated macroscopically using laser interferometers and polarization-electric field loop measurements. However, as the research focus is shifted from bulk to nanosized materials, scanning probe microscopy (SPM) techniques have been suggested as an alternative approach for evaluating piezoelectric and ferroelectric properties. In this Progress Report, the recent progress on the nanoscale evaluation of piezoelectric and ferroelectric properties of diverse materials using SPM-based methods is summarized. Among the SPM techniques, the focus is on recent studies that are related to piezoresponse force microscopy and conductive atomic force microscopy; further, the utilization of these two modes to understand piezoelectric and ferroelectric properties at the nanoscale level is discussed. This work can provide guidelines for evaluating the piezoelectric and ferroelectric properties of materials based on SPM techniques.

Indexed as

conductive atomic force microscopyferroelectricitypiezoelectricitypiezoresponse force microscopyscanning probe microscopy

Identifiers

PMID32995111
PMCPMC7507502

What OpenQuestion holds

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Registered trials

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Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.