ArticleJournal of synchrotron radiation2020
Deciphering the intrinsic dynamics from the beam-induced atomic motions in oxide glasses.
Article in Journal of synchrotron radiation, 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 4 papers.
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Who cites it
4 citing papers in PubMed, 7 citations in OpenAlex.
- High-pressure X-ray photon correlation spectroscopy at fourth-generation synchrotron sources.Journal of synchrotron radiation · 2024Article
- Stochastic atomic acceleration during the X-ray-induced fluidization of a silica glass.Proceedings of the National Academy of Sciences of the United States of America · 2023Article
- Resolving molecular diffusion and aggregation of antibody proteins with megahertz X-ray free-electron laser pulses.Nature communications · 2022Article
- Performance of the time-resolved ultra-small-angle X-ray scattering beamline with the Extremely Brilliant Source.Journal of applied crystallography · 2022Article
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Authors and funding
1 author at 1 institution in 1 country.
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Abstract
Probing the microscopic slow structural relaxation in oxide glasses by X-ray photon correlation spectroscopy (XPCS) revealed faster than expected dynamics induced by the X-ray illumination. The fast beam-induced dynamics mask true slow structural relaxation in glasses and challenges application of XPCS to probe the atomic dynamics in oxide glasses. Here an approach that allows estimation of the true relaxation time of the sample in the presence of beam-induced dynamics is presented. The method requires two measurements either with different X-ray beam intensities or at different temperatures. Using numerical simulations it is shown that the slowest estimated true relaxation time is limited by the accuracy of the measured relaxation times of the sample. By analyzing the reported microscopic dynamics in SiO
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