Evidence map›Paper›PMID 32489233›Full record

ArticleRadiation physics and chemistry (Oxford, England : 1993)2020

Contemporary x-ray wavelength metrology and traceability.

L T Hudson, J P Cline, A Henins, M H Mendenhall, C I Szabo

Abstract read
In one paragraph

Article in Radiation physics and chemistry (Oxford, England : 1993), 2020. The graph could read no effect estimate from its abstract, so it casts no vote on the map. Cited by 3 papers.

0numbers the graph read from it
0cells of the map it votes in
3citing papers in PubMed
–field-weighted citation impact
1 · What the graph read from it

What it found

Each row is one number read from the abstract, on the scale the paper reported it, with its interval. Left of the dashed line favours the treatment, right favours the comparator. Under each row is the sentence it came from. New to these charts? A ten-minute tutorial.

The abstract states no effect estimate the extractor could read, or names no intervention and outcome on the map, so this paper lights no cell and moves no belief. It is still indexed, cited and linked below.

2 · The registry

The trial behind it

Trials whose registry record cites this paper, or whose number appears in the abstract. A trial that started after this paper was published is citing it as background, not reporting it.

Neither the registry nor the abstract names a trial number. If this is a trial report, that itself is worth knowing.

3 · Its place in the literature

Who cites it

3 citing papers in PubMed.

  1. Article
  2. Article
  3. The NIST Vacuum Double-Crystal Spectrometer: A Tool for SI-Traceable Measurement of X-Ray Emission Spectra.Journal of research of the National Institute of Standards and Technology · 2021
    Article
4 · The record

Corrections and comments

PubMed lists nothing against this paper. Absence here is not a guarantee, only a check that was made.

5 · Who and what money

Authors and funding

5 authors.

L T HudsonNational Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, MD, 20899, USA.
J P ClineNational Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, MD, 20899, USA.
A HeninsNational Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, MD, 20899, USA.
M H MendenhallNational Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, MD, 20899, USA.
C I SzaboNational Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, MD, 20899, USA.

Funding

Intramural NIST DOC 9999-NIST
6 · The paper itself

Abstract

We report recent advances in absolute x-ray wavelength metrology in the context of producing modern standard reference data. Primary x-ray wavelength standards are produced today using diffraction spectrometers using crystal optics arranged to be operated in dispersive and non-dispersive geometries, giving natural-line-width limited profiles with high resolution and accuracy. With current developments, measurement results can be made traceable to the

Indexed as

Reference dataStandardsTraceabilityWavelength metrologyX-ray spectroscopy

Identifiers

PMID32489233
PMCPMC7266105

What OpenQuestion holds

Textmetadata
LicenceTDM
Read underepoch 390

Registered trials

None linked

Read under generation 80e0d062 · epoch 390. Bibliography from PubMed, PubMed Central and OpenAlex; grants from NIH RePORTER; trial links from ClinicalTrials.gov; estimates, votes and beliefs from the OpenQuestion graph.